Abstract: The present invention relates to a method and system for providing an analog Gaussian noise signal having the predetermined probability distribution function, bandwidth and center frequency. A band-limited digital noise signal indicative of a Gaussian noise signal having a predetermined Gaussian probability distribution function is ?? modulated generating a pulse-density modulated 1-bit sequence representing a Gaussian noise signal having a predetermined probability distribution function, bandwidth and center frequency. Using an analog low-pass filter the pulse-density modulated 1-bit sequence is then converted into a respective analog Gaussian noise signal having the predetermined probability distribution function, bandwidth and center frequency. The method and system are successfully employed in numerous applications such as in histogram testing and probabilistic digitization.

Abstract: The present invention relates to a method and system for high-speed bandpass serial data communication. A driver receives at least one data signal and generates a bandpass data signal for transmission through a bandpass waveguide interconnect. The bandpass data signal is launched into the bandpass waveguide interconnect using a first adaptor and extracted therefrom after transmission using a second adaptor. A receiver connected to the second adaptor recovers the at least one data signal from the extracted bandpass data signal. A dispersion compensation circuit receives one of the at least one data signal and the bandpass data signal and information indicative of a phase response of the bandpass waveguide interconnect and dispersion compensates the one of the at least one data signal and the bandpass data signal by compensating the phase response of the bandpass waveguide interconnect.

Abstract: The present invention relates to a method and system for high-speed bandpass serial data communication. A driver receives at least one data signal and generates a bandpass data signal for transmission through a bandpass waveguide interconnect. The bandpass data signal is launched into the bandpass waveguide interconnect using a first adaptor and extracted therefrom after transmission using a second adaptor. A receiver connected to the second adaptor recovers the at least one data signal from the extracted bandpass data signal. A dispersion compensation circuit receives one of the at least one data signal and the bandpass data signal and information indicative of a phase response of the bandpass waveguide interconnect and dispersion compensates the one of the at least one data signal and the bandpass data signal by compensating the phase response of the bandpass waveguide interconnect.

Abstract: The present invention relates to a method and system for providing an analog Gaussian noise signal having the predetermined probability distribution function, bandwidth and center frequency. A band-limited digital noise signal indicative of a Gaussian noise signal having a predetermined Gaussian probability distribution function is ?? modulated generating a pulse-density modulated 1-bit sequence representing a Gaussian noise signal having a predetermined probability distribution function, bandwidth and center frequency. Using an analog low-pass filter the pulse-density modulated 1-bit sequence is then converted into a respective analog Gaussian noise signal having the predetermined probability distribution function, bandwidth and center frequency. The method and system are successfully employed in numerous applications such as in histogram testing and probabilistic digitization.

Abstract: A method of providing an on-chip high-speed time domain digital analyzer for the characterization and analysis of signals within an integrated circuit is provided. The method involves processing the signal being characterized/analyzed in the digital domain irrespective of it's starting format. The approach performs a voltage-to-time conversion using predetermined voltage thresholds, applying a time amplification to the digital time information, measuring the amplified time difference between events and converting the amplified time difference as required by the characterization/analysis. The method allows the capture of very high-speed signals with high resolution without the requirements of complex and high-speed electronics. As such the on-chip high-speed time domain digital analyzer can function as an oscilloscope, pulse width analyzer, rise time analyzer and even logic analyzer.

Abstract: A method of providing an on-chip high-speed time domain digital analyzer for the characterization and analysis of signals within an integrated circuit is provided. The method involves processing the signal being characterized/analyzed in the digital domain irrespective of it's starting format. The approach performs a voltage-to-time conversion using predetermined voltage thresholds, applying a time amplification to the digital time information, measuring the amplified time difference between events and converting the amplified time difference as required by the characterization/analysis. The method allows the capture of very high-speed signals with high resolution without the requirements of complex and high-speed electronics. As such the on-chip high-speed time domain digital analyzer can function as an oscilloscope, pulse width analyzer, rise time analyzer and even logic analyzer.

Abstract: A multi-speed jittered signal generator (216, 400) that generates a full-speed jittered signal (404) by scaling a low-speed jittered signal (420) using a frequency scaler (428). The low-speed jittered signal is created by injecting a modulation signal (416) into a reference signal (412) using a jitter injector (432). Injecting jitter into a low-speed reference signal allows the full-speed jittered signal to be of higher quality than conventional jitter signals created by injecting jitter information into a full-speed reference signal. The multi-speed jittered signal generator may be used as part of a testing system (208) for testing various circuitry, such as high-speed serializer/deserializer circuitry (220).

Abstract: A module (236, 236?) containing an integrated testing system (108) that includes one or more measurement engines (200, 202) tightly coupled with a compute engine (208). The one or more measurement engines include at least one stimulus instrument (212) for exciting circuitry of a device-under-test (104) with one or more stimulus signals, and at least one measurement instrument (216) that measures the response of the device-under-test to the stimulus signal(s) and generates measurement data. The compute engine includes computation logic circuitry (800) for determining whether or not the circuitry aboard the device-under-test passes or fails. The integrated testing system further includes a communications engine (204) providing two-way communications between the integrated testing system automated testing equipment (116) and/or a dedicated user interface (140) residing on a host computer (136).

Abstract: An integrated test core for mixed-signal circuits comprises a periodic waveform generator capable of generating arbitrary band-limited waveforms for excitation purposes and a waveform digitizer for extracting an arbitrary waveform from the test circuit's analog response signal. The digitized response may be tested and measured using DSP techniques. Preferably, the waveform generator and digitizer are synchronously controlled. The core is a nearly all digital implementation with the exception of a reconstruction filter (optional) for sending the test signal to the circuit under test (CUT) and the comparator for extracting the digitized waveform from the CUT's response. The periodic waveform generator may comprise a ?? modulator and, optionally, a reconstruction filter between the modulator and CUT.

Abstract: A system and device suitable for use in performing a DC parametric test on an external load is provided. The device may be configured to apply a desired voltage or current to the external load. The circuit device receives a forcing parameter signal at an input and releases at an output a signal approximating the forcing parameter signal to the external load. The circuit device includes a first circuit segment between the input and the output having a search unit, an intermediate voltage point and an internal load between the intermediate voltage point and the output. A second circuit segment connected in a feedback arrangement with the first circuit segment provides the search unit with the voltage at the output. The search unit is adapted for generating a second voltage signal on the basis of the forcing parameter signal and the first voltage signal received and to apply the second voltage signal to the intermediate voltage point.

Abstract: An efficient technique for generating accurate on-chip DC reference voltages is based on filtering a digital pulse modulated sequence in order to extract its average value encoding a DC level, A passive on-chip filter is used for simplicity with an all-digital modulator implementation. Modulation is proposed using pulse-width and preferably pulse-density modulation methods. The latter has the advantage of using a significantly smaller filter which translates into a smaller implementation and faster operational settling times. Many digital pulse modulation generators are proposed.

Abstract: In recent years, much effort has been placed on improving the performance of timing and jitter measurement devices using Delay Locked Loop (DLL) and Vernier Delay Line (VDL) techniques. However, these approaches require highly matched elements in order to reduce differential non-linearity timing errors. In an attempt to reduce the requirement on element matching, a component-invariant VDL technique is disclosed that enables the measurement device to be synthesized from an RTL description. The present invention is based on a single-stage VDL structure, which is used to mimic the behavior of a complete VDL. Furthermore, as test time is an important consideration during a production test, a method and system is provided that reduces test time at the expense of additional hardware.

Abstract: A system and device suitable for use in performing a DC parametric test on an external load is provided. The device may be configured to apply a desired voltage or current to the external load. The circuit device receives a forcing parameter signal, at an input and releases at an output a signal approximating the forcing parameter signal to the external load. The circuit device includes a first circuit segment between the input and the output having a search unit, an intermediate voltage point and an internal load between the intermediate voltage point and the output. A second circuit segment connected in a feedback arrangement with the first circuit segment provides the search unit with the voltage at the output. The search unit is adapted for generating a second voltage signal on the basis of the forcing parameter signal and the first voltage signal received and to apply the second voltage signal to the intermediate voltage point.

Abstract: A system and device suitable for use in performing a DC parametric test on an external load is provided. The device may be configured to apply a desired voltage or current to the external load. The circuit device receives a forcing parameter signal at an input and releases at an output a signal approximating the forcing parameter signal to the external load. The circuit device includes a first circuit segment between the input and the output having a search unit, an intermediate voltage point and an internal load between the intermediate voltage point and the output. A second circuit segment connected in a feedback arrangement with the first circuit segment provides the search unit with the voltage at the output. The search unit is adapted for generating a second voltage signal on the basis of the forcing parameter signal and the first voltage signal received and to apply the second voltage signal to the intermediate voltage point.

Abstract: A system and device suitable for use in performing a DC parametric test on an external load is provided. The device may be configured to apply a desired voltage or current to the external load. The circuit device receives a forcing parameter signal at an input and releases at an output a signal approximating the forcing parameter signal to the external load. The circuit device includes a first circuit segment between the input and the output having a search unit, an intermediate voltage point and an internal load between the intermediate voltage point and the output. A second circuit segment connected in a feedback arrangement with the first circuit segment provides the search unit with the voltage at the output. The search unit is adapted for generating a second voltage signal on the basis of the forcing parameter signal and the first voltage signal received and to apply the second voltage signal to the intermediate voltage point.

Abstract: An efficient technique for generating accurate on-chip DC reference voltages is based on filtering a digital pulse modulated sequence in order to extract its average value encoding a DC level, A passive on-chip filter is used for simplicity with an all-digital modulator implementation. Modulation is proposed using pulse-width and preferably pulse-density modulation methods. The latter has the advantage of using a significantly smaller filter which translates into a smaller implementation and faster operational settling times. Many digital pulse modulation generators are proposed.

Abstract: In recent years, much effort has been placed on improving the performance of timing and jitter measurement devices using Delay Locked Loop (DLL) and Vernier Delay Line (VDL) techniques. However, these approaches require highly matched elements in order to reduce differential non-linearity timing errors. In an attempt to reduce the requirement on element matching, a component-invariant VDL technique is disclosed that enables the measurement device to be synthesized from an RTL description. The present invention is based on a single-stage VDL structure, which is used to mimic the behavior of a complete VDL. Furthermore, as test time is an important consideration during a production test, a method and system is provided that reduces test time at the expense of additional hardware.

Abstract: An integrated test core for mixed-signal circuits comprises a periodic waveform generator capable of generating arbitrary band-limited waveforms for excitation purposes and a waveform digitizer for extracting an arbitrary waveform from the test circuit's analog response signal. The digitized response may be tested and measured using DSP techniques. Preferably, the waveform generator and digitizer are synchronously controlled. The core is a nearly all digital implementation with the exception of a reconstruction filter (optional) for sending the test signal to the circuit under test (CUT) and the comparator for extracting the digitized waveform from the CUT's response. The periodic waveform generator may comprise a &Sgr;&Dgr;modulator and, optionally, a reconstruction filter between the modulator and CUT.