Patents by Inventor Gordon W. Watson

Gordon W. Watson has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Probe device for testing an integrated circuit
    Patent number: 4623839
    Abstract: A plurality of probes for contacting the pads of an integrated circuit are cantilevered within the aperture of a ceramic ring. The probes are fixed to the ring with an adhesive and a second ceramic ring is positioned on them to support them against contact forces. The probes are soldered to conductive tracks on the first ring for connection to test apparatus, providing a very rigid and dimensionally accurate and stable probe arrangement. The device can be constructed with the probes in contact with a sample integrated circuit, in a quick and simple process.
    Type: Grant
    Filed: September 15, 1983
    Date of Patent: November 18, 1986
    Assignee: Angliatech Limited
    Inventors: Oliver R. Garretson, Gordon W. Watson