Patents by Inventor Gottfried P. Kibelka

Gottfried P. Kibelka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10895565
    Abstract: An analysis system includes a volatile organic compound (VOC) detection assembly enclosed in a housing assembly and configured to detect VOCs in a liquid. A thermal control assembly is disposed in the housing assembly and is configured to circulate air enclosed within the housing assembly and control an interior temperature of the housing. The VOC analysis system may be controlled to periodically conduct a VOC detection process. The thermal control assembly may be controlled to circulate air enclosed within the housing assembly and control the temperature of the enclosed air.
    Type: Grant
    Filed: June 3, 2016
    Date of Patent: January 19, 2021
    Assignee: Parker-Hannifin Corporation
    Inventors: Michael Lewis Doutt, Glenn Stacey Geis, Kazi Z. A. Hassan, Walter C. Cameron, Taylor J. Wingo, Gottfried P. Kibelka
  • Publication number: 20180136187
    Abstract: An analysis system includes a volatile organic compound (VOC) detection assembly enclosed in a housing assembly and configured to detect VOCs in a liquid. A thermal control assembly is disposed in the housing assembly and is configured to circulate air enclosed within the housing assembly and control an interior temperature of the housing. The VOC analysis system may be controlled to periodically conduct a VOC detection process. The thermal control assembly may be controlled to circulate air enclosed within the housing assembly and control the temperature of the enclosed air.
    Type: Application
    Filed: June 3, 2016
    Publication date: May 17, 2018
    Inventors: Michael Lewis Doutt, Glenn Stacey Geis, Kazi Z. A. Hassan, Walter C. Cameron, Taylor J. Wingo, Gottfried P. Kibelka
  • Patent number: 7550722
    Abstract: A focal plane detector assembly of a mass spectrometer includes an ion detector configured to detect ions crossing a focal plane of the spectrometer and an electrically conductive mesh lying in a plane parallel to the focal plane, positioned such that ions exiting a magnet of the mass spectrometer pass through the mesh before contacting the ion detector. The mesh is maintained at a low voltage potential, relative to a circuit ground, which shields ions passing through the magnet from high voltage charges from other devices, such as microchannel plate electron multipliers. The mesh may be mounted directly to the magnet or positioned some distance away. The detector array may include any suitable device, including a faraday cup detector array, a strip charge detector array, or a CCD detector array.
    Type: Grant
    Filed: March 4, 2005
    Date of Patent: June 23, 2009
    Assignee: OI Corporation
    Inventors: Adi A. Scheidemann, Gottfried P. Kibelka, Clare R. Long, Mark W. Dassel
  • Patent number: 7442920
    Abstract: Mass spectrometer systems for measuring mass/charge ratios of analytes are described. A mass spectrometer system includes a vacuum flange, a PCB base plate coupled to the vacuum flange, and an ion optic assembly coupled to the PCB base plate. The PCB base plate may include signal-processing electronics. The system may include an electrical cable coupled to the PCB base plate for supplying power, control, and I/O to the ion optic assembly and the signal processing electronics. Alternatively, a mass spectrometer system includes a PCB base plate and an ion optic assembly. The PCB base plate has a sealant portion and an electrical portion. The ion optic assembly is coupled to the electrical portion. The system may include a vacuum housing for enclosing the ion optic assembly. The vacuum housing is coupled to the sealant portion of the PCB base plate for sustaining a vacuum while the system is in operation.
    Type: Grant
    Filed: August 16, 2005
    Date of Patent: October 28, 2008
    Assignee: O. I. Corporation
    Inventors: Adi A. Scheidemann, Mark S. McGraw, Clare R. Long, Gottfried P. Kibelka
  • Patent number: 7223972
    Abstract: An analytical instrument, such as a mass spectrometer, the instrument having a magnetic section with a controllable electromagnetic field. Controlling the electromagnetic field is accomplished by controlling a temperature of a base plate within the magnetic section, by controlling a current passing through an electromagnetic coil disposed within the magnetic, by disposing a magnetic shunt across a portion of a yoke of the magnet, or by any of the above either independently or in combination. The magnetic shunt is configured to have a temperature coefficient of remnant flux density that is opposite the temperature coefficient of remnant flux density of a first pair of permanent magnets located within the magnetic section.
    Type: Grant
    Filed: March 31, 2005
    Date of Patent: May 29, 2007
    Assignee: OI Corporation
    Inventors: Eustathios Vassiliou, Gottfried P. Kibelka