Patents by Inventor Gou Fukano
Gou Fukano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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NONVOLATILE SEMICONDUCTOR MEMORY DEVICE WITH A PLURALITY OF MEMORY BLOCKS AND A SHARED BLOCK DECODER
Publication number: 20220005528Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: September 10, 2021Publication date: January 6, 2022Inventor: Gou FUKANO -
Patent number: 11120875Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: GrantFiled: January 24, 2020Date of Patent: September 14, 2021Assignee: KIOXIA CORPORATIONInventor: Gou Fukano
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NONVOLATILE SEMICONDUCTOR MEMORY DEVICE WITH A PLURALITY OF MEMORY BLOCKS AND A SHARED BLOCK DECODER
Publication number: 20200160912Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: January 24, 2020Publication date: May 21, 2020Inventor: Gou FUKANO -
Nonvolatile semiconductor memory device with a plurality of memory blocks and a shared block decoder
Patent number: 10580493Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: GrantFiled: March 7, 2019Date of Patent: March 3, 2020Assignee: TOSHIBA MEMORY CORPORATIONInventor: Gou Fukano -
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE WITH A PLURALITY OF MEMORY BLOCKS AND A SHARED BLOCK DECODER
Publication number: 20190206493Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: March 7, 2019Publication date: July 4, 2019Inventor: Gou FUKANO -
Nonvolatile semiconductor memory device with a plurality of memory blocks and a shared block decoder
Patent number: 10276240Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: GrantFiled: May 21, 2018Date of Patent: April 30, 2019Assignee: Toshiba Memory CorporationInventor: Gou Fukano -
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE WITH A PLURALITY OF MEMORY BLOCKS AND A SHARED BLOCK DECODER
Publication number: 20180268904Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: May 21, 2018Publication date: September 20, 2018Inventor: Gou FUKANO -
Nonvolatile semiconductor memory device with a plurality of memory blocks and a shared block decoder
Patent number: 10008268Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: GrantFiled: April 26, 2017Date of Patent: June 26, 2018Assignee: Toshiba Memory CorporationInventor: Gou Fukano -
Publication number: 20170229181Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: April 26, 2017Publication date: August 10, 2017Inventor: Gou FUKANO
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Patent number: 9666284Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: GrantFiled: May 11, 2016Date of Patent: May 30, 2017Assignee: Kabushiki Kaisha ToshibaInventor: Gou Fukano
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Publication number: 20160254055Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: May 11, 2016Publication date: September 1, 2016Inventor: Gou FUKANO
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Patent number: 9368213Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: GrantFiled: April 16, 2015Date of Patent: June 14, 2016Assignee: Kabushiki Kaisha ToshibaInventor: Gou Fukano
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Publication number: 20150294722Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: April 16, 2015Publication date: October 15, 2015Inventor: Gou FUKANO
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Patent number: 9053765Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: GrantFiled: March 4, 2013Date of Patent: June 9, 2015Assignee: Kabushiki Kaisha ToshibaInventor: Gou Fukano
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Publication number: 20140084353Abstract: A nonvolatile semiconductor memory device with a first region including a memory cell array of a plurality of memory cells arrayed in three dimensions and a second region with a peripheral circuit for controlling the memory cell array is described. The peripheral circuit includes an insulating film and a template region. The template region has a length and a width and the insulating film is spaced from (does not overlap) the edges of the template region and is arranged in the template region so that a coverage ratio of the template region is at least above a minimum coverage ratio of 30-50%. Satisfying the minimum coverage ratio allows the device layers above the second region to be formed with sufficient flatness to allow the memory device to be functional.Type: ApplicationFiled: March 4, 2013Publication date: March 27, 2014Inventor: Gou FUKANO
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Publication number: 20140086001Abstract: A nonvolatile semiconductor memory device includes a memory cell array having multiple blocks each with a plurality of memory strings. Each memory string has multiple memory cells connected in series between first and second selection transistors. The device further includes a row decoder, a block decoder, first and second signal line groups, and a switch circuit. The row decoder has transfer transistors through which voltages are supplied to the selection transistors. The block decoder supplies a selection signal that indicates whether the first group or the second group has been selected. The first and second signal line groups are connected to the selection transistors of the memory strings that are in the respective first and second memory blocks of the first and second groups. The switch circuit connects the first and second signal line groups to the respective first and second memory blocks of the selected group.Type: ApplicationFiled: March 4, 2013Publication date: March 27, 2014Applicant: KABUSHIKI KAISHA TOSHIBAInventor: Gou FUKANO
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Patent number: 8437170Abstract: According to one embodiment, a semiconductor storage device includes memory cells including serially-connected variable-resistance layer and diode. A memory cell array includes the memory cells arranged on a plane including a first and second axes and has a first region lying along an edge of the array and a second region lying opposite to the edge with respect to the first region. A first wiring is continuous along the first axis between both ends of the array, partly lies in the second region, and is connected to the first ends of the memory cells. A second wiring lies along the first axis only in the first region, is connected to the first ends of the memory cells, and is divided between adjacent memory cells. A third wiring is continuous along the second axis between both ends of the array, and connected to the second ends of the memory cells.Type: GrantFiled: August 26, 2010Date of Patent: May 7, 2013Assignee: Kabushiki Kaisha ToshibaInventor: Gou Fukano
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Patent number: 8295070Abstract: According to one embodiment, a resistance change memory includes a stacked layer structure stacked on a semiconductor substrate in order of a first conductive line, a first variable resistance element, a second conductive line, a second variable resistance element, . . . a n-th conductive line, a n-th variable resistance element and a (n+1)-th conductive line, where n is a natural number equal to or larger than 2, and a first to a n-th drivers which drives the first to the (n+1)-th conductive lines. The odd-numbered conductive lines are extends in a first direction along a surface of the semiconductor substrate. The even-numbered conductive lines are extends in a second direction along the surface of the semiconductor substrate. Sizes of the first to (n+1)-th drivers become large gradually from the first driver to the (n+1)-th driver.Type: GrantFiled: December 15, 2010Date of Patent: October 23, 2012Assignee: Kabushiki Kaisha ToshibaInventor: Gou Fukano
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Publication number: 20120049148Abstract: According to one embodiment, a three-dimensional nonvolatile semiconductor memory includes a semiconductor substrate, a memory cell array includes memory cells stacked on the semiconductor substrate and first conductive layers connected to the memory cells, a dummy stacked layer structure includes second conductive layers stacked on the semiconductor substrate, and surrounding the memory cell array, and a metal layer provided on the memory cell array and the dummy stacked layer structure. The second conductive layers are fixed on a ground potential.Type: ApplicationFiled: August 31, 2011Publication date: March 1, 2012Inventor: Gou FUKANO
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Publication number: 20110164444Abstract: According to one embodiment, a resistance change memory includes a stacked layer structure stacked on a semiconductor substrate in order of a first conductive line, a first variable resistance element, a second conductive line, a second variable resistance element, . . . a n-th conductive line, a n-th variable resistance element and a (n+1)-th conductive line, where n is a natural number equal to or larger than 2, and a first to a n-th drivers which drives the first to the (n+1)-th conductive lines. The odd-numbered conductive lines are extends in a first direction along a surface of the semiconductor substrate. The even-numbered conductive lines are extends in a second direction along the surface of the semiconductor substrate. Sizes of the first to (n+1)-th drivers become large gradually from the first driver to the (n+1)-th driver.Type: ApplicationFiled: December 15, 2010Publication date: July 7, 2011Inventor: Gou FUKANO