Abstract: A method of remotely monitoring electromigration in an electronic chip includes sensing, at a first location, at least one temperature value of the electronic chip, sending the at least one temperature value to a remote monitoring system, accumulating a plurality of temperature values of the electronic chip at the monitoring system during a reporting period, calculating an Electromigration Life Consumed (EMLC) value of the electronic chip for the reporting period based on the plurality of temperature values, determining whether the EMLC of the electronic chip is above a predetermined threshold, and providing a signal when the EMLC of the electronic chip is above the predetermined threshold.

Abstract: A method of remotely monitoring electromigration in an electronic chip includes sensing, at a first location, at least one temperature value of the electronic chip, sending the at least one temperature value to a remote monitoring system, accumulating a plurality of temperature values of the electronic chip at the monitoring system during a reporting period, calculating an Electromigration Life Consumed (EMLC) value of the electronic chip for the reporting period based on the plurality of temperature values, determining whether the EMLC of the electronic chip is above a predetermined threshold, and providing a signal when the EMLC of the electronic chip is above the predetermined threshold.