Abstract: A vehicle having a scanning unit and a detection unit is disclosed. The scanning unit may scan and detect an occupant presence in a vehicle interior portion. The detection unit may detect a trigger event associated with the vehicle. The vehicle may further include a processor configured to obtain a trigger event information from the detection unit. The processor may further determine a scanning unit setting based on the trigger event information. The scanning unit setting may be associated with at least one of a scan order, a fidelity mode and a scan frequency for the scanning unit. The processor may determine the scanning unit setting such that a vehicle power consumption may be optimized. The processor may further output a control signal to the scanning unit to scan the vehicle interior portion based on the determined scanning unit setting.

Abstract: A system for testing a subject transistor with constant power. The system may include an amplifier, a measurement voltage source, and a exercise voltage source. The amplifier may have an output connected to a gate of the subject transistor. The amplifier may have a first input and a second input. The measurement voltage source may be connected to the first input of the amplifier for use in measuring characteristics of the subject transistor. The exercise voltage source may be connected to the first input of the amplifier for exercising the subject transistor. The second input of the amplifier may be connected to a source of the subject transistor through a resistor.

Abstract: A system for testing a subject transistor with constant power. The system may include an amplifier, a measurement voltage source, and a exercise voltage source. The amplifier may have an output connected to a gate of the subject transistor. The amplifier may have a first input and a second input. The measurement voltage source may be connected to the first input of the amplifier for use in measuring characteristics of the subject transistor. The exercise voltage source may be connected to the first input of the amplifier for exercising the subject transistor. The second input of the amplifier may be connected to a source of the subject transistor through a resistor.