Patents by Inventor Grant W. WAGNER
Grant W. WAGNER has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11085949Abstract: A probe card assembly for nondestructive integrated circuit testing is disclosed. The probe card assembly includes an outer gimbal bearing with a tapered bearing surface being mounted on a top surface of a printed circuit board. The probe card assembly further includes an inner gimbal bearing with a spherical bearing surface which contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact about a circumference thereof. The probe card assembly further includes a spring plate mounted to the outer gimbal bearing, providing a downward force to a substrate.Type: GrantFiled: October 18, 2019Date of Patent: August 10, 2021Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dustin Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant W. Wagner
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Patent number: 11029334Abstract: A probe includes a pedestal and at least one feature extending from the pedestal to engage a surface of a corresponding contact at a position offset from a central longitudinal axis of the contact. The pedestal includes a cavity and the feature can include one or more blades that extend from a periphery of the cavity to a central longitudinal axis of the pedestal. The three blades are configured to engage the surface of the contact. The three blades can be positioned within the cavity to provide a 120-degree rotational symmetry about the central longitudinal axis of the pedestal.Type: GrantFiled: August 9, 2019Date of Patent: June 8, 2021Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Patent number: 10663487Abstract: A system for testing functionality of die on a wafer including a plurality of contacts includes a support structure and a plurality of probes mounted to the support structure in an array. A configuration of each of the plurality of probes varies based on a position of the probe within the array to maintain uniform engagement between the plurality of probes and a corresponding plurality of contacts across the array.Type: GrantFiled: February 28, 2019Date of Patent: May 26, 2020Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Patent number: 10578648Abstract: A probe card assembly for nondestructive integrated circuit testing is disclosed. The probe card assembly includes an outer gimbal bearing with a tapered bearing surface being mounted on a top surface of a printed circuit board. The probe card assembly further includes an inner gimbal bearing with a spherical bearing surface which contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact about a circumference thereof. The probe card assembly further includes a spring plate mounted to the outer gimbal bearing, providing a downward force to a substrate.Type: GrantFiled: August 8, 2017Date of Patent: March 3, 2020Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dustin Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant W. Wagner
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Publication number: 20200049738Abstract: A probe card assembly for nondestructive integrated circuit testing is disclosed. The probe card assembly includes an outer gimbal bearing with a tapered bearing surface being mounted on a top surface of a printed circuit board. The probe card assembly further includes an inner gimbal bearing with a spherical bearing surface which contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact about a circumference thereof. The probe card assembly further includes a spring plate mounted to the outer gimbal bearing, providing a downward force to a substrate.Type: ApplicationFiled: October 18, 2019Publication date: February 13, 2020Inventors: David M. AUDETTE, Dustin FREGEAU, David L. GARDELL, Peter W. NEFF, Frederick H. ROY, III, Grant W. Wagner
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Publication number: 20190361048Abstract: A probe includes a pedestal and at least one feature extending from the pedestal to engage a surface of a corresponding contact at a position offset from a central longitudinal axis of the contact.Type: ApplicationFiled: August 9, 2019Publication date: November 28, 2019Inventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Patent number: 10444260Abstract: A probe includes a pedestal and at least one feature extending from the pedestal to engage a surface of a corresponding contact at a position offset from a central longitudinal axis of the contact.Type: GrantFiled: July 12, 2016Date of Patent: October 15, 2019Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Publication number: 20190195913Abstract: A system for testing functionality of die on a wafer including a plurality of contacts includes a support structure and a plurality of probes mounted to the support structure in an array. A configuration of each of the plurality of probes varies based on a position of the probe within the array to maintain uniform engagement between the plurality of probes and a corresponding plurality of contacts across the array.Type: ApplicationFiled: February 28, 2019Publication date: June 27, 2019Inventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Patent number: 10261108Abstract: A system for testing functionality of die on a wafer including a plurality of contacts includes a support structure and a plurality of probes mounted to the support structure in an array. A configuration of each of the plurality of probes varies based on a position of the probe within the array to maintain uniform engagement between the plurality of probes and a corresponding plurality of contacts across the array.Type: GrantFiled: July 12, 2016Date of Patent: April 16, 2019Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Publication number: 20180017596Abstract: A system for testing functionality of die on a wafer including a plurality of contacts includes a support structure and a plurality of probes mounted to the support structure in an array. A configuration of each of the plurality of probes varies based on a position of the probe within the array to maintain uniform engagement between the plurality of probes and a corresponding plurality of contacts across the array.Type: ApplicationFiled: July 12, 2016Publication date: January 18, 2018Inventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Publication number: 20180017592Abstract: A probe includes a pedestal and at least one feature extending from the pedestal to engage a surface of a corresponding contact at a position offset from a central longitudinal axis of the contact.Type: ApplicationFiled: July 12, 2016Publication date: January 18, 2018Inventors: David M. Audette, Dennis R. Conti, Marc D. Knox, Grant W. Wagner
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Publication number: 20170356933Abstract: A probe card assembly for nondestructive integrated circuit testing is disclosed. The probe card assembly includes an outer gimbal bearing with a tapered bearing surface being mounted on a top surface of a printed circuit board. The probe card assembly further includes an inner gimbal bearing with a spherical bearing surface which contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact about a circumference thereof. The probe card assembly further includes a spring plate mounted to the outer gimbal bearing, providing a downward force to a substrate.Type: ApplicationFiled: August 8, 2017Publication date: December 14, 2017Inventors: David M. AUDETTE, Dustin FREGEAU, David L. GARDELL, Peter W. NEFF, Frederick H. ROY, III, Grant W. Wagner
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Patent number: 9797928Abstract: The disclosure describes a probe card assembly for nondestructive integrated circuit testing. The probe card assembly includes an outer gimbal bearing with a tapered bearing surface being mounted on a top surface of a printed circuit board. The probe card assembly further includes an inner gimbal bearing with a spherical bearing surface which contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact about a circumference thereof. The probe card assembly further includes a spring plate mounted to the outer gimbal bearing, providing a downward force to a substrate.Type: GrantFiled: September 15, 2014Date of Patent: October 24, 2017Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dustin Fregeau, David L. Gardell, Peter W. Neff, Frederick H. Roy, III, Grant W. Wagner
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Publication number: 20160077129Abstract: A probe card assembly for nondestructive integrated circuit testing is disclosed. The probe card assembly includes an outer gimbal bearing with a tapered bearing surface being mounted on a top surface of a printed circuit board. The probe card assembly further includes an inner gimbal bearing with a spherical bearing surface which contacts the tapered bearing surface of the outer gimbal bearing at a single point of contact about a circumference thereof.Type: ApplicationFiled: September 15, 2014Publication date: March 17, 2016Inventors: David M. AUDETTE, Dustin FREGEAU, David L. GARDELL, Peter W. NEFF, Frederick H. ROY, III, Grant W. Wagner
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Patent number: 9116200Abstract: Methodologies and test configurations are provided for testing thermal interface materials and, in particular, methodologies and test configurations are provided for testing thermal interface materials used for testing integrated circuits. A test methodology includes applying a thermal interface material on a device under test. The test methodology further includes monitoring the device under test with a plurality of temperature sensors. The test methodology further includes determining whether any of the plurality of temperature sensors increases above a steady state.Type: GrantFiled: April 2, 2013Date of Patent: August 25, 2015Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Dustin Fregeau, David L. Gardell, Laura L. Kosbar, Keith C. Stevens, Grant W. Wagner
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Patent number: 9086433Abstract: A probe conducts testing of a circuit. The probe includes a base coupled to a substrate. The probe also includes a cantilever attached to the base at a first end, the cantilever deflecting from a first position to a second position in which a second end opposite the first end is in contact with the substrate and to move between the second position and the first position based on movement of a compliant bump of the circuit, and a probe tip attached to the cantilever at the second end, the probe tip maintaining contact with the compliant bump of the circuit.Type: GrantFiled: December 19, 2012Date of Patent: July 21, 2015Assignee: International Business Machines CorporationInventors: David M. Audette, Dustin Fregeau, David L. Gardell, Grant W. Wagner
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Patent number: 9081034Abstract: A method of probing compliant bumps of a circuit with probes is described. The method includes disposing the probes on a substrate, a base of each of the probes being coupled to the substrate. The method also includes disposing the circuit such that each of the compliant bumps is in contact with the probe tip of a corresponding one of the probes, each probe tip being connected to each base of each probe through a cantilever, and supplying current to the probes to test the circuit.Type: GrantFiled: February 1, 2013Date of Patent: July 14, 2015Assignee: International Business Machines CorporationInventors: David M. Audette, Dustin Fregeau, David L. Gardell, Grant W. Wagner
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Publication number: 20140167802Abstract: A method of probing compliant bumps of a circuit with probes is described. The method includes disposing the probes on a substrate, a base of each of the probes being coupled to the substrate. The method also includes disposing the circuit such that each of the compliant bumps is in contact with the probe tip of a corresponding one of the probes, each probe tip being connected to each base of each probe through a cantilever, and supplying current to the probes to test the circuit.Type: ApplicationFiled: February 1, 2013Publication date: June 19, 2014Applicant: International Business Machines CorporationInventors: David M. Audette, Dustin Fregeau, David L. Gardell, Grant W. Wagner
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Publication number: 20140167801Abstract: A probe conducts testing of a circuit. The probe includes a base coupled to a substrate. The probe also includes a cantilever attached to the base at a first end, the cantilever deflecting from a first position to a second position in which a second end opposite the first end is in contact with the substrate and to move between the second position and the first position based on movement of a compliant bump of the circuit, and a probe tip attached to the cantilever at the second end, the probe tip maintaining contact with the compliant bump of the circuit.Type: ApplicationFiled: December 19, 2012Publication date: June 19, 2014Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: David M. Audette, Dustin Fregeau, David L. Gardell, Grant W. Wagner
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Publication number: 20130229198Abstract: Methodologies and test configurations are provided for testing thermal interface materials and, in particular, methodologies and test configurations are provided for testing thermal interface materials used for testing integrated circuits. A test methodology includes applying a thermal interface material on a device under test. The test methodology further includes monitoring the device under test with a plurality of temperature sensors. The test methodology further includes determining whether any of the plurality of temperature sensors increases above a steady state.Type: ApplicationFiled: April 2, 2013Publication date: September 5, 2013Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Dustin FREGEAU, David L. GARDELL, Laura L. KOSBAR, Keith C. STEVENS, Grant W. WAGNER