Abstract: A method and system for implementing NAND programming of flash devices during in-circuit testing is described. A flash programmer may receive a program file from an in-circuit tester and device information from a NAND flash device, including information regarding bad cells. The flash programmer converts the program file to account for the bad cells and then programs the NAND flash device with the converted program file. The ability of the flash programmer to translate between the in-circuit tester and a unit under test also allows for more efficient programming of other flash devices.

Abstract: A method and system for implementing buffer programming of flash devices during in-circuit testing is described. Some flash device can implement buffer programming, but the ICT is not capable of supporting this application. By creating a file for buffer programming of flash devices that has the same number of bits in each line and counting the number of lines in the file having data, flash devices can be programmed using buffer programming with the ICT. Additionally, by adjusting the line count to an even multiple of the length of an executable code stored in the flash device, program loops may be used.

Abstract: A method and system for parallel programming flash devices during in-circuit testing is described. A parallel processing device is located in a test fixture of an In-Circuit Tester (ICT) for each printed circuit board (PCB) connected to the test fixture. The parallel processing device controls the communications between the ICT and the PCB. The parallel processing device facilitates parallel programming of flash devices that passed in-circuit testing. The parallel processing device prevents programming of flash devices that failed in-circuit testing.

Abstract: A method and system for implementing NAND programming of flash devices during in-circuit testing is described. A flash programmer may receive a program file from an in-circuit tester and device information from a NAND flash device, including information regarding bad cells. The flash programmer converts the program file to account for the bad cells and then programs the NAND flash device with the converted program file. The ability of the flash programmer to translate between the in-circuit tester and a unit under test also allows for more efficient programming of other flash devices.