Abstract: An analyzer and method of analyzing a sample are provided. The method includes providing a sample on a substrate, and irradiating the sample with at least three incident beams of light. Each of the incident beams contains light of a different frequency, and the sample is substantially transmissive at each of the different frequencies. The method also includes providing a light sensing arrangement to receive light patterns from the incident beams that have passed through the substrate, and analyzing properties of the sample through identifying properties of the light patterns arising from diffraction of the light of the three incident beams by the sample. A difference in frequency between first and second ones of the incident beams is the same as a difference in frequency between second and third ones of the incident beams.