Patents by Inventor Greg Dyck

Greg Dyck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Obtaining extended queue measurement data for a range of logical control unit queues
    Publication number: 20080109580
    Abstract: I/O measurement data for channels attached to logical control unit queues is obtained related to a plurality of logical control unit queues. A store secondary queue measurement data instruction specifies a range of queues for which extended secondary measurement blocks derived from the I/O measurement data are stored at a memory address specified by the store secondary queue measurement data instruction.
    Type: Application
    Filed: December 28, 2007
    Publication date: May 8, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Scott Carlson, Greg Dyck, Tan Lu, Kenneth Oakes, Dale Riedy, William Rooney, John Trotter, Leslie Wyman, Harry Yudenfriend
  • Extended Input/Output Measurement Word Facility, and Emulation of that Facility
    Publication number: 20080103755
    Abstract: An Extended Input/output (I/O) measurement word facility is provided. Provision is made for emulation of the Extended I/O measurement word facility. The facility provides for storing measurement data associated with a single I/O operation in an extended measurement word associated with an I/O response block. In a further aspect, the stored data may have a resolution of approximately one-half microsecond.
    Type: Application
    Filed: December 28, 2007
    Publication date: May 1, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Scott Carlson, Greg Dyck, Tan Lu, Kenneth Oakes, Dale Riedy, William Roeney, John Trotter, Leslie Wyman, Harry Yudenfriend
  • Emulation of Extended Input/Output Measurement Block Facilities
    Publication number: 20080103754
    Abstract: An Extended Input/output (I/O) measurement block facility is emulated. The facility provides for the collection of relevant I/O measurement data, and the storing for later efficient retrieval of that data in an extended measurement block. The stored data relates to the performance of an I/O subchannel.
    Type: Application
    Filed: December 28, 2007
    Publication date: May 1, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Scott Carlson, Greg Dyck, Tan Lu, Kenneth Oakes, Dale Riedy, William Rooney, John Trotter, Leslie Wyman, Harry Yudenfriend
  • Gathering I/O Measurement Data During an I/O Operation Process
    Publication number: 20070079022
    Abstract: I/O measurement data associated with the performance of an I/O operation process is gathered during the I/O process. The I/O measurement data is saved in an IRB memory location specified by a test subchannel instruction. An I/O interrupt signals the completion of the I/O operation process.
    Type: Application
    Filed: September 1, 2006
    Publication date: April 5, 2007
    Inventors: Scott Carlson, Greg Dyck, Tan Lu, Kenneth Oakes, Dale Riedy, William Rooney, John Trotter, Leslie Wyman, Harry Yudenfriend
  • Extended input/output measurement block
    Publication number: 20060075154
    Abstract: An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.
    Type: Application
    Filed: November 18, 2005
    Publication date: April 6, 2006
    Applicant: International Business Machines Corporation
    Inventors: Scott Carlson, Greg Dyck, Tan Lu, Kenneth Oakes, Dale Riedy, William Rooney, John Trotter, Leslie Wyman, Harry Yudenfriend
  • Obtaining queue measurement data for a range of logical control unit queues
    Publication number: 20050216617
    Abstract: I/O measurement data for channels attached to logical control unit queues is obtained related to a plurality of logical control unit queues. A store secondary queue measurement data instruction specifies a range of queues for which extended secondary measurement blocks derived from the I/O measurement data are stored at a memory address specified by the store secondary queue measurement data instruction.
    Type: Application
    Filed: May 11, 2005
    Publication date: September 29, 2005
    Applicant: International Business Machines Corporation
    Inventors: Scott Carlson, Greg Dyck, Tan Lu, Kenneth Oakes, Dale Riedy,, William Rooney, John Trotter, Leslie Wyman, Harry Yudenfriend
  • Gathering I/O measurement data during an I/O operation process
    Publication number: 20050204069
    Abstract: I/O measurement data associated with the performance of an I/O operation process is gathered during the I/O process. The I/O measurement data is saved in an IRB memory location specified by a test subchannel instruction. An I/O interrupt signals the completion of the I/O operation process.
    Type: Application
    Filed: May 11, 2005
    Publication date: September 15, 2005
    Applicant: International Business Machines Corporation
    Inventors: Scott Carlson, Greg Dyck, Tan Lu, Kenneth Oakes, Dale Riedy, William Rooney, John Trotter, Leslie Wyman, Harry Yudenfriend