Abstract: Systems, devices, and/or methods for use in passive wireless transmission of one or more parameters such as, e.g., pH, temperature, etc. are described. The systems, devices, and/or methods may use a passive sensor located proximate a material and an interrogator that may be used to interrogate the passive sensor and to receive a signal from the passive sensor representative of the one or more parameters.

Abstract: Systems, devices, and/or methods for use in detection of reinforcement metal corrosion within material, such as concrete, are described. The systems, devices, and/or methods may use a passive sensor located within the material and an interrogator located outside of the material that may be used to interrogate the passive sensor and to receive a signal from the passive sensor representative of corrosion potential of reinforcement metal.

Abstract: Systems, devices, and/or methods for use in passive wireless transmission of one or more parameters such as, e.g., pH, temperature, etc. are described. The systems, devices, and/or methods may use a passive sensor located proximate a material and an interrogator that may be used to interrogate the passive sensor and to receive a signal from the passive sensor representative of the one or more parameters.

Abstract: Systems, devices, and/or methods for use in detection of reinforcement metal corrosion within material, such as concrete, are described. The systems, devices, and/or methods may use a passive sensor located within the material and an interrogator located outside of the material that may be used to interrogate the passive sensor and to receive a signal from the passive sensor representative of corrosion potential of reinforcement metal.

Abstract: A sub-micron probe apparatus to be added to an existing probe station. In one embodiment, the probe apparatus includes a course positioning unit to be optionally mounted or added to an existing probe station platform. A fine positioning unit is attached to an arm attached to the course positioning unit. A cantilever having a tip is attached to a support structure attached to the fine positioning unit. The course and fine positioning units are used to place the cantilever and tip over a surface of a device under test (DUT). Motion of the cantilever is detected with a motion sensor. An image of the surface of the DUT may be obtained. In addition, an electrical signal carried in an electrical trace on or near the surface of the DUT can be detected. An electrical signal may also be supplied to the electrical trace on or near the surface of the DUT. The field of vision of an optical imager used to image the DUT at the probe area is not obstructed by the probe apparatus.

Abstract: A method and an apparatus for providing non-contact measurement of waveforms proximate to a surface of a sample. In one embodiment, the described apparatus includes a composite probe waveform generator configured to provide a composite probe waveform having a plurality of overlapping component probe waveforms. Each of the overlapping component probe waveforms have a repetition rate substantially equal to the repetition rate of the sample waveform to be measured from the sample. The apparatus includes a cantilever with a signal path to carry the composite probe waveform to a position above the sample surface where the sample waveform is to be measured. In one embodiment, each of the component probe waveforms of the composite probe waveform is modulated at a frequency near a mechanical resonance frequency of the cantilever.

Abstract: A method and an apparatus for providing non-contact measurement of waveforms proximate to a surface of a sample. In one version, the describe apparatus includes a probe waveform generator that generates probe waveforms with the same repetition rate as a sample waveform to the measured from the sample. The apparatus includes a cantilever with a signal path to carry the probe waveform to a position above the sample surface where the sample waveform is to be measured. The apparatus of the present invention also includes a gate to periodically route the probe waveforms to the cantilever tip. The gate is controlled by a periodic gating signal with a period substantially longer than the signal period of the sample waveform. In one version, the gate is switched at a repetition rate substantially equal to a mechanical resonant repetition rate of the cantilever. Capacitive coupling between the cantilever and the signal line of the sample results in a periodic motion of the cantilever at the gating repetition rate.