Patents by Inventor Greg I. LaBonte

Greg I. LaBonte has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8606536
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: October 15, 2009
    Date of Patent: December 10, 2013
    Assignee: Test Acuity Solutions, Inc.
    Inventors: Emilio Miguelanez, Greg I. LaBonte
  • Publication number: 20100036637
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Application
    Filed: October 15, 2009
    Publication date: February 11, 2010
    Inventors: Emilio Miguelanez, Greg I. LaBonte