Patents by Inventor Greg LaBonte

Greg LaBonte has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8788237
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations. A method and apparatus according to various aspects of the present invention may operate in conjunction with a test system having a tester, such as automatic test equipment (ATE) for testing semiconductors.
    Type: Grant
    Filed: March 29, 2013
    Date of Patent: July 22, 2014
    Assignee: Test Acuity Solutions
    Inventors: Emilio Miguelanez, Greg LaBonte
  • Patent number: 7904279
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
    Type: Grant
    Filed: September 19, 2007
    Date of Patent: March 8, 2011
    Assignee: Test Advantage, Inc.
    Inventors: Emilio Miguelanez, Michael J. Scott, Greg LaBonte
  • Publication number: 20080091977
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified according to multiple parameters, such as spatial relationships, variations in the test data, and correlations to other test data.
    Type: Application
    Filed: September 19, 2007
    Publication date: April 17, 2008
    Inventors: Emilio Miguelanez, Michael Scott, Greg LaBonte
  • Publication number: 20070219741
    Abstract: Methods and apparatus for data analysis according to various aspects of the present invention are configured to identify statistical outliers in test data for components, including hybrid outliers representing outliers within subsets of larger data populations.
    Type: Application
    Filed: September 27, 2006
    Publication date: September 20, 2007
    Inventors: Emilio Miguelanez, Greg LaBonte