Patents by Inventor Greg Olmstead

Greg Olmstead has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD OF MEASURING AND ASSESSING A PROBE CARD WITH AN INSPECTION DEVICE
    Publication number: 20170276758
    Abstract: A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the probe card analyzer, aligning a sensor head of the probe card analyzer with the probe card, and measuring a component of the probes with the sensor head.
    Type: Application
    Filed: June 14, 2017
    Publication date: September 28, 2017
    Applicant: Rudolph Technologies, Inc.
    Inventor: Greg Olmstead
  • Method of measuring and assessing a probe card with an inspection device
    Patent number: 9684052
    Abstract: A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the probe card analyzer, aligning a sensor head of the probe card analyzer with the probe card, and measuring a component of the probes with the sensor head.
    Type: Grant
    Filed: June 6, 2014
    Date of Patent: June 20, 2017
    Assignee: Rudolph Technologies, Inc.
    Inventor: Greg Olmstead
  • Inspection device with vertically moveable assembly
    Patent number: 9535089
    Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.
    Type: Grant
    Filed: May 20, 2014
    Date of Patent: January 3, 2017
    Assignee: Rudolph Technologies, Inc.
    Inventors: Gary Mark Gunderson, Greg Olmstead
  • METHOD OF MEASURING AND ASSESSING A PROBE CARD WITH AN INSPECTION DEVICE
    Publication number: 20150054534
    Abstract: A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the probe card analyzer, aligning a sensor head of the probe card analyzer with the probe card, and measuring a component of the probes with the sensor head.
    Type: Application
    Filed: June 6, 2014
    Publication date: February 26, 2015
    Inventor: Greg Olmstead
  • INSPECTION DEVICE WITH VERTICALLY MOVEABLE ASSEMBLY
    Publication number: 20140253166
    Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.
    Type: Application
    Filed: May 20, 2014
    Publication date: September 11, 2014
    Applicant: RUDOLPH TECHNOLOGIES, INC.
    Inventors: Gary Mark Gunderson, Greg Olmstead
  • Inspection device with vertically moveable assembly
    Patent number: 8729917
    Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.
    Type: Grant
    Filed: April 25, 2011
    Date of Patent: May 20, 2014
    Assignee: Rudolph Technologies, Inc.
    Inventors: Gary Mark Gunderson, Greg Olmstead
  • INSPECTION DEVICE WITH VERTICALLY MOVEABLE ASSEMBLY
    Publication number: 20120098563
    Abstract: The inspection of semiconductors or like substrates by the present mechanism minimizes deflection in the checkplate and probe card. An inspection device including a housing, a toggle assembly within the housing, an objective lens assembly attached within the toggle assembly including an objective coupled within an objective focus, wherein the objective focus is deflectable along an optics axis, and a cam assembly including a rotary cam and a window carrier, wherein the window carrier is moveable along the optics axis with rotation of the rotary cam, wherein the cam assembly is coupled to the toggle assembly with the objective and window are aligned along the optics axis.
    Type: Application
    Filed: April 25, 2011
    Publication date: April 26, 2012
    Applicant: RUDOLPH TECHNOLOGIES, INC.
    Inventors: Gary Mark Gunderson, Greg Olmstead