Abstract: Systems for interconnecting magnetic heads of storage devices in a test assembly are provided. In one embodiment, the invention relates to a probe assembly for coupling a read head to a cavity gimbal assembly, the probe assembly including a plurality of conductive probes each including a body section including two substantially flat side surfaces and a bottom surface including a pad configured to be soldered to a corresponding pad of a laminated flexure of the cavity gimbal assembly, a spring section including an elongated arm extending away from the body section, the elongated arm shaped to make conductive contact with a pad on a trailing face of the read head, and a non-conductive adhesive layer attached to at least one of the two side surfaces, where each of the plurality of the conductive probes is attached to an adjacent one of the conductive probes by one of the adhesive layers.