Patents by Inventor Greg Schaadt

Greg Schaadt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20090190825
    Abstract: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.
    Type: Application
    Filed: January 26, 2009
    Publication date: July 30, 2009
    Applicant: Texas Instruments Incorporated
    Inventors: Igor Volfman, Andrew Huibers, Satyadev Patel, Peter Richards, Leonid Frenkel, Jim Dunphy, Regis Grasser, Greg Schaadt
  • Patent number: 7483126
    Abstract: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.
    Type: Grant
    Filed: June 23, 2004
    Date of Patent: January 27, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Igor Volfman, Andrew Huibers, Satyadev Patel, Peter Richards, Leonid Frenkel, Jim Dunphy, Regis Grasser, Greg Schaadt
  • Publication number: 20050286045
    Abstract: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.
    Type: Application
    Filed: June 23, 2004
    Publication date: December 29, 2005
    Inventors: Igor Volfman, Andrew Huibers, Satyadev Patel, Peter Richards, Leonid Frenkel, Jim Dunphy, Regis Grasser, Greg Schaadt