Abstract: A method of evaluating a layout cell for electrostatic discharge (ESD) protection can include identifying at least one feature of the layout cell for use in implementing an integrated circuit (IC) and comparing the at least one feature of the layout cell to an ESD requirement for the IC. The method can include indicating whether the feature of the layout cell complies with the ESD requirement.

Abstract: A data link interface can include a programmable delay chain configured to provide an amount of delay to a first clock signal that clocks a first portion of a data path. The data link interface can include a phase interpolator configured to determine an amount of phase offset applied to a second clock signal that clocks a second portion of the data path. The data link interface further can include a latency detector coupled to the programmable delay chain and the phase interpolator. The latency detector can measure a phase difference between the first and second clock signals and vary the amount of delay applied to the first clock signal and/or the amount of phase offset on the second clock signal responsive to the phase difference.

Abstract: A method and apparatus for clock phase alignment are described. An external clock is aligned to an internal clock by adjusting phase of the external clock. The external clock is of a physical medium attachment clock domain, and the internal clock is of a physical coding clock domain. After the aligning of the external clock to the internal clock, the external clock is maintained. The internal clock is aligned to the external clock by adjusting phase of the internal clock.

Abstract: Alignment of a clock signal to a particular phase is described. In one aspect, a method includes receiving an incoming clock signal and multiple phased clock signals, each of the phased clock signals having a different phase and a substantially same phase offset from another phased clock signal. At least one detection signal based on the incoming and phased clock signals is provided, and one or more errors contributed by noise in at least the incoming clock signal are corrected in the at least one detection signal. Based on the at least one detection signal, one of the phased clock signals is selected as the most closely aligned of the phased clock signals to the predetermined clock phase, and the selected clock signal is output.

Abstract: Embodiments of an integrated circuit driver, a method for operating integrated circuit driver, and predrivers are described. In one embodiment of the integrated circuit driver, a bias control circuit provides a bias signal for a first mode and a second mode. The bias signal has a first voltage level associated with operation in the first mode and a second voltage level associated with operation in the second mode. An output driver circuit receives the bias signal. In the first mode, the output driver circuit operates as a supply referenced driver, and in the second mode, the output driver circuit operates as a ground referenced driver.

Abstract: Preventing transistor damage to an integrated circuit is described. The circuit includes a switch with a first pair of p-type transistors respectively coupled in source-drain parallel with second pair of p-type transistors for preventing Negative Bias Temperature Instability (“NBTI”) damage to the second pair of p-type transistors. The switch is configured to such that when in a state associated with causing, or potentially causing, NBTI damage, both of the second pair of p-type transistors are in an OFF state for preventing NBTI damage thereto.