Abstract: Analog switch circuits, methods for use with analog switch circuits, and devices and systems including analog switch circuits are disclosed herein. Such analog switch circuits include an analog switch input terminal (In), an analog switch output terminal (Out), and an analog switch control terminal (Ctl). During a normal-voltage condition, the input terminal (In) of the analog switch circuit is selectively connected and disconnected to/from the output terminal (Out) in dependence on a control signal received at the control terminal (Ctl). During an over-voltage condition, the input terminal (In) is disconnected from the output terminal (Out) regardless of the control signal received at the control terminal (Ctl). Additionally, during an under-voltage condition, the input terminal (In) is disconnected from the output terminal (Out) regardless of the control signal received at the analog switch control terminal (Ctl).

Abstract: Analog switch circuits, methods for use with analog switch circuits, and devices and systems including analog switch circuits are disclosed herein. Such analog switch circuits include an analog switch input terminal (In), an analog switch output terminal (Out), and an analog switch control terminal (Ctl). During a normal-voltage condition, the input terminal (In) of the analog switch circuit is selectively connected and disconnected to/from the output terminal (Out) in dependence on a control signal received at the control terminal (Ctl). During an over-voltage condition, the input terminal (In) is disconnected from the output terminal (Out) regardless of the control signal received at the control terminal (Ctl). Additionally, during an under-voltage condition, the input terminal (In) is disconnected from the output terminal (Out) regardless of the control signal received at the analog switch control terminal (Ctl).

Abstract: A electrostatic discharge (ESD) clamp for coupling between first and second nodes for providing ESD protection including a clamp circuit and first and second voltage threshold circuits. The clamp circuit limits operating voltage between the first and second nodes to a maximum level when activated. The first and second voltage threshold circuits each have a selectable threshold voltage, such as by coupling one or more voltage threshold devices in series. The first voltage threshold circuit triggers to turn on the clamp circuit when the operating voltage increases above a first voltage threshold. The second voltage threshold circuit triggers when the clamp circuit is turned on and is turned off to turn off the clamp circuit when the operating voltage decreases to the second threshold voltage. The second threshold voltage may be selected at any level above the nominal operating voltage to prevent the clamp from latching.

Abstract: An integrated analog switch including first and second semiconductor devices and a current mirror. The first device is a switching device having first and second current terminals coupled between first and second switch terminals. When turned off, the body of the first device is pulled to a bias voltage, and a first leakage current flows between its body and the first switch terminal. The second device is a reduced-size replica of the first device having one current terminal coupled to the first switch terminal and having its body pulled to about the bias voltage when turned off. The second device provides a second leakage current which is proportional to the leakage current of the first device. The current mirror circuit mirrors and amplifies the second leakage current to provide a cancellation current which is applied to the first switch terminal to cancel leakage current.

Abstract: A method of a modeling metallization parasitics with the use of a simulation program. In one embodiment, a method of simulating interconnect lines in an electronic design automation simulation is disclosed. The method comprises partitioning the interconnect lines into groups of interconnect lines. Each group of interconnect lines does not have interactions with any of the other groups of interconnect lines. Moreover, at least one of the groups of interconnect lines contains at least three interconnect lines. The interconnect lines in each group are modeled. The modeling includes at least one of modeling mutual inductances and modeling of mutual capacitances.

Abstract: An electrostatic discharge protection circuit for an integrated circuit that reduces unwanted transient currents during normal operations. In one embodiment, the electrostatic discharge protection circuit includes one or more electrostatic bus lines, a plurality of signal bonding pads and charge pumps. The one or more electrostatic bus lines are used to direct electrostatic discharge around internal circuitry. The plurality of signal bonding pads are used to receive external voltage signals. Each signal bonding pad is coupled to an associated electrostatic bus line via an unidirectional conducting device. A charge pump is used on each electrostatic bus line to precharge its associated electrostatic bus line to an associated predetermined voltage level.

Abstract: An electrostatic discharge protection circuit for an integrated circuit that reduces unwanted transient currents during normal operations. In one embodiment, the electrostatic discharge protection circuit includes one or more electrostatic bus lines, a plurality of signal bonding pads and charge pumps. The one or more electrostatic bus lines are used to direct electrostatic discharge around internal circuitry. The plurality of signal bonding pads are used to receive external voltage signals. Each signal bonding pad is coupled to an associated electrostatic bus line via an unidirectional conducting device. A charge pump is used on each electrostatic bus line to precharge its associated electrostatic bus line to an associated predetermined voltage level.

Abstract: A reference current/voltage gnereator is insensitive to variations in power supply voltage and temperature. The operational parameters of matched current mirror transistors of the generator are effectively equalized by an auxiliary bias amplifier, whose transistors are matched with and connected to the current mirror transistors of the generator in such a manner as to maintain the same electrical parameters in each of the current mirror legs of the current generator, irrespective of variations in supply voltage. Temperature insensitivity is achieved by making the output current mirror a current that is the sum of two currents whose current paths complementary temperature coefficients.

Abstract: A reference current/voltage gnereator is insensitive to variations in power supply voltage and temperature. The operational parameters of matched current mirror transistors of the generator are effectively equalized by an auxiliary bias amplifier, whose transistors are matched with and connected to the current mirror transistors of the generator in such a manner as to maintain the same electrical parameters in each of the current mirror legs of the current generator, irrespective of variations in supply voltage. Temperature insensitivity is achieved by making the output current mirror a current that is the sum of two currents whose current paths complementary temperature coefficients.

Abstract: An electrostatic discharge locating system may include a plurality of receivers and a central unit. Each receiver may include an antenna. The receivers may receive radio wave signals emanating from an electrostatic discharge event and transmit the signals to the central unit for processing. The central unit may determine the location of an electrostatic discharge event from the relative time of signal reception or the signal amplitudes along with predetermined locations of the receivers.

Abstract: A Schmitt trigger-configured overvoltage protection circuit has a hysteresis turn-on, turn-off characteristic that minimizes its sensitivity to noise, and is effective to protect an integrated circuit against a DC overvoltage condition, and electrostatic discharge-based transients, while allowing `hot` insertion of a device containing the clamping circuit into an already powered-up system. The protection circuit employs a reference device, such as a Zener diode, that enables the clamping circuit trigger threshold to be set at a value that is independent of the power supply voltage.

Abstract: An integrated circuit includes protected circuit portions for being electrically connected to an electronic circuit via electrical conductors, and a multiple time constant transient clamping circuit for clamping a transient voltage based upon one of first and second time constants. The first time constant is preferably selected when the integrated circuit is electrically connected to the electronic circuit and is preferably relatively short to permit operation and while protecting the IC from a transient voltage, such as an electrostatic discharge (ESD) event. The longer second time constant is preferably selected when the IC is removed or not electrically connected to the electronic circuit. The longer second time constant is preferably sufficiently long to protect the IC from a transient voltage when the IC is not electrically connected to the circuit board.

Abstract: A high voltage protection circuit includes breakdown networks for providing a discharge path between a pair of terminals of a circuit to be protected. Each network conducts current between a supply terminal and another terminal at a low threshold voltage value when power is removed from the supply terminal. The network increases the threshold value when power is applied to the supply terminal to prevent conduction through the breakdown network during normal operation of the circuit to be protected. In one implementation, the protection circuit includes anti-latching circuitry connected to the breakdown network for preventing the breakdown network from latching on after or during the time power is applied to the supply terminals. To minimize the degradation of DC operating characteristics, the leakage currents, due to the protection circuit, between the first terminal and the positive supply terminal, and between the first terminal and the negative supply terminal cancel each other.

Abstract: An SCR clamp provides a low impedance discharge path for static charges across on IC's pins. The SCR clamp cathode, cathode, gate anode, and anode gate float when the protected IC is disconnected from its associated circuit elements. Under this condition, the SCR clamp can be turned on at the low Vh and Ih levels of the SCR, allowing the clamp to operate to discharge static electricity at the low voltage determined by SCR junction biases.

Abstract: A monolithic voltage clamp provides low impedance, low voltage electrostatic discharge protection for an integrated circuit without affecting the integrated circuit's DC characteristics. First, second, third, and fourth regions of semiconducting material are formed with p-n junctions between each region. A first inductor electrically connects the first and second regions, and a second inductor electrically connects the third and fourth regions. The first and second inductors should each have an inductance which is large enough to delay an increase in bypass current around their respective p-n junctions for a period which is long enough to assure that conduction is sufficient to discharge an electrostatic pulse. In a preferred embodiment, first and second reverse bias diodes are used to electrically connect the invention to one or more input/output nodes.

Abstract: A high voltage protection circuit includes a breakdown network for providing a discharge path between a pair of terminal of a circuit to be protected. Each network conducts current between a supply terminal and another terminal at a low threshold voltage value when power is removed from the supply terminal. The network increases the threshold value when power is applied to the supply terminal to prevent conduction through the breakdown network during normal operation of the circuit to be protected. In one implementation, the protection circuit includes anti-latching circuitry connected to the breakdown network for preventing the breakdown network from latching on after or during the time power is applied to the supply terminals. To minimize the degradation of DC operating characteristics, the leakage currents, due to the protection circuit, between the first terminal and the positive supply terminal, and between the first terminal and the negative supply terminal cancel each other.