Patents by Inventor Gregor Edward Van Baars
Gregor Edward Van Baars has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230221651Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: ApplicationFiled: March 21, 2023Publication date: July 13, 2023Applicant: ASML NETHERLANDS B.V.Inventors: Catharinus DE SCHIFFART, Michael Jozef Mathijs RENKENS, Gerard VAN SCHOTHORST, Andre Bernardus JEUNINK, Gregor Edward VAN BAARS, Sander Frederik WUISTER, Yvonne Wendela KRUIJT-STEGEMAN, Norbert Erwin Therenzo JANSEN, Toon HARDEMAN, George Arie Jan DE FOCKERT, Johan Frederik DIJKSMAN
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Patent number: 11635696Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: GrantFiled: December 14, 2020Date of Patent: April 25, 2023Assignee: ASML NETHERLANDS B.V.Inventors: Catharinus De Schiffart, Michael Jozef Mathijs Renkens, Gerard Van Schothorst, Andre Bernardus Jeunink, Gregor Edward Van Baars, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman, Norbert Erwin Therenzo Jansen, Toon Hardeman, George Arie Jan De Fockert, Johan Frederik Dijksman
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Publication number: 20210096468Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: ApplicationFiled: December 14, 2020Publication date: April 1, 2021Applicant: ASML NETHERLANDS B.V.Inventors: Catharinus DE SCHIFFART, Michael Jozef Mathijs RENKENS, Gerard VAN SCHOTHORST, Andre Bernardus JEUNINK, Gregor Edward VAN BAARS, Sander Frederik WUISTER, Yvonne Wendela KRUIJT-STEGEMAN, Norbert Erwin Therenzo JANSEN, Toon HARDEMAN, George Arie Jan DE FOCKERT, Johan Frederik DIJKSMAN
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Patent number: 10908510Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: GrantFiled: August 26, 2019Date of Patent: February 2, 2021Assignee: ASML Netherlands B.V.Inventors: Catharinus De Schiffart, Michael Jozef Mathijs Renkens, Gerard Van Schothorst, Andre Bernardus Jeunink, Gregor Edward Van Baars, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman, Norbert Erwin Therenzo Jansen, Toon Hardeman, George Arie Jan De Fockert, Johan Frederik Dijksman
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Patent number: 10890851Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: GrantFiled: December 1, 2017Date of Patent: January 12, 2021Assignee: ASML Netherlands B.V.Inventors: Catharinus De Schiffart, Michael Jozef Mathijs Renkens, Gerard Van Schothorst, Andre Bernardus Jeunink, Gregor Edward Van Baars, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman, Norbert Erwin Therenzo Jansen, Toon Hardeman, George Arie Jan De Fockert, Johan Frederik Dijksman
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Publication number: 20190377265Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: ApplicationFiled: August 26, 2019Publication date: December 12, 2019Applicant: ASML NETHERLANDS B.V.Inventors: Catharinus DE SCHIFFART, Michael Jozef Mathijs RENKENS, Gerard VAN SCHOTHORST, Andre Bernardus JEUNINK, Gregor Edward VAN BAARS, Sander Frederik WUISTER, Yvonne Wendela KRUIJT-STEGEMAN, Norbert Erwin Therenzo JANSEN, Toon HARDEMAN, George Arie Jan DE FOCKERT, Johan Frederik DIJKSMAN
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Publication number: 20180088468Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: ApplicationFiled: December 1, 2017Publication date: March 29, 2018Applicant: ASML NETHERLANDS B.V.Inventors: Catharinus DE SCHIFFART, Michael Jozef Mathijs RENKENS, Gerard VAN SCHOTHORST, Andre Bernardus JEUNINK, Gregor Edward VAN BAARS, Sander Frederik WUISTER, Yvonne Wendela KRUIJT-STEGEMAN, Norbert Erwin Therenzo JANSEN, Toon HARDEMAN, George Arie Jan DE FOCKERT, Johan Frederik DIJKSMAN
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Patent number: 9864279Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: GrantFiled: June 14, 2011Date of Patent: January 9, 2018Assignee: ASML NETHERLANDS B.V.Inventors: Catharinus De Schiffart, Michael Jozef Mathijs Renkens, Gerard Van Schothorst, Andre Bernardus Jeunink, Gregor Edward Van Baars, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman, Norbert Erwin Therenzo Jansen, Toon Hardeman, George Arie Jan De Fockert, Johan Frederik Dijksman
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Patent number: 9304401Abstract: A radiation spot measurement system for a lithographic apparatus, the system having a target onto which a radiation system of the lithographic apparatus may project spots of radiation for a measurement process, the target having a measurement target. The system further includes a radiation detector to detect radiation from one of the spots, and a controller to receive information from the radiation detector and to determine the position of the spot of radiation relative to an intended position of the spot of radiation.Type: GrantFiled: February 22, 2012Date of Patent: April 5, 2016Assignee: ASML NETHERLANDS B.V.Inventors: Felix Godfried Peter Peeters, Jozef Petrus Henricus Benschop, Michael Jozef Mathijs Renkens, Gregor Edward Van Baars, Jeroen Dekkers
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Publication number: 20130335721Abstract: A radiation spot measurement system for a lithographic apparatus, the system having a target onto which a radiation system of the lithographic apparatus may project spots of radiation for a measurement process, the target having a measurement target. The system further includes a radiation detector to detect radiation from one of the spots, and a controller to receive information from the radiation detector and to determine the position of the spot of radiation relative to an intended position of the spot of radiation.Type: ApplicationFiled: February 22, 2012Publication date: December 19, 2013Applicant: ASML neTHERLANDS B.V.Inventors: Felix Godfried Peter Peeters, Jozef Petrus Henricus Benschop, Michael Jozef Mathijs Renkens, Gregor Edward Van Baars, Jeroen Dekkers
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Publication number: 20130182236Abstract: An imprint lithography apparatus having a first frame to be mounted on a floor, a second frame mounted on the first frame via a kinematic coupling, an alignment sensor mounted on the second frame, to align an imprint lithography template arrangement with a target portion of a substrate, and a position sensor to measure a position of the imprint lithography template arrangement and/or a substrate stage relative to the second frame.Type: ApplicationFiled: June 14, 2011Publication date: July 18, 2013Applicant: ASML Netherlands B.V.Inventors: Catharinus De Schiffart, Michael Jozef Mathijs Renkens, Gerard Van Schothorst, Andre Bernardus Jeunink, Gregor Edward Van Baars, Sander Frederik Wuister, Yvonne Wendela Kruijt-Stegeman, Norbert Erwin Therenzo Jansen, Toon Hardeman, George Arie Jan De Fockert, Johan Frederik Dijksman
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Patent number: 7181296Abstract: By applying time-frequency analysis to a given standard iterative learning control or ILC an adaptive filter for the learned feed-forward loop is designed. This time varying filter varies according to the momentary frequency content of the error signal and allows to discriminate between areas of deterministic and stochastic error. Its application results in selective application of ILC to those intervals where error signals of high level are concentrated and allows application of a single ILC acquisition to different setpoint trajectories. The adaptive filter finds particular use in lithographic scanning systems where it is used for varying scan length.Type: GrantFiled: June 1, 2004Date of Patent: February 20, 2007Assignee: ASML Netherlands B.V.Inventors: Andreea Iuliana Rotariu, Rogier Ellenbroek, Maarten Steinbuch, Gregor Edward Van Baars