Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: Methods and apparatus for determining carrier frequency error of a serial offset quadrature pulse shaped signal, such as a minimum shift keyed (MSK) signal, are disclosed. Carrier frequency error is determined by receiving a quadrature pulse shaped signal having a synchronization sequence, detecting synchronization of the quadrature pulse shaped signal, and storing a baseband inphase (I) signal and a baseband quadrature (Q) signal of the synchronization sequence while detecting synchronization. After detecting synchronization, segments of the stored baseband I and Q signals are read and correlated with a spreading sequence. Carrier frequency error is then estimated based on phase differences between each of the correlated segments.

Abstract: A communication method and apparatus includes a transmitter of radio-frequency electromagnetic energy (RF) at a first location. A passive, modulated reflector at a second location reflects incident RF, and is modulated by information to be communicated. The reflected RF thus includes the information. A receiver remote from the reflector receives the reflected, modulated RF and extracts the information therefrom. The receiver may be co-located with the transmitter.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device.

Abstract: The present invention is directed to a system comprised of a computer, at least one integrated circuit tester, a communications link enabling communications between the integrated circuit tester and the computer, and a computer-readable medium. The computer-readable medium contains a sequence of instructions that, when executed, create a set of tests for integrated circuit testing. The set of tests may include only those tests that are calculated to be statistically significant. A second set of tests may be created that includes only those tests that are calculated to be statistically insignificant. The computer monitors the test results and moves tests between the two sets to ensure that only statistically significant tests are in the first group and that only statistically insignificant tests are in the second group.

Abstract: The present invention is directed to a system comprised of a computer, at least one integrated circuit tester, a communications link enabling communications between the integrated circuit tester and the computer, and a computer-readable medium. The computer-readable medium contains a sequence of instructions that, when executed, create a set of tests for integrated circuit testing. The set of tests may include only those tests that are calculated to be statistically significant. A second set of tests may be created that includes only those tests that are calculated to be statistically insignificant. The computer monitors the test results and moves tests between the two sets to ensure that only statistically significant tests are in the first group and that only statistically insignificant tests are in the second group.

Abstract: An apparatus for processing an integrated circuit device comprises at least one insert having at least one beveled hole therein, the insert adapted to receive at least one semiconductor device. The apparatus further includes a tray having a pocket for receiving the insert and a slot, a deformable segment on the insert, and at least three posts on the insert. Further included is at least one tab on the deformable segment with one of the slots receiving the tab. The slot in the tray and the tab on the insert movably attaches the insert to the tray, the insert being self-aligning to a processing apparatus thereby in conjunction with the posts and allowing for removal of the insert from the pocket.

Abstract: An inventive method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC devices; advancing multiple lots of the IC devices through, for example, a test step in the manufacturing process in a substantially continuous manner; generating data, such as test data, related to the advancement of each of the IC devices through the step in the process; and associating the data generated for each of the IC devices with the fuse ID of its associated IC device. By associating the data with the fuse ID's, the inventive method allows the IC devices to be tracked through the step in the process. Further, because multiple lots of the IC devices can advance through the step in the process continuously, manufacturing resources are used more efficiently.

Abstract: An apparatus for processing an integrated circuit device comprises at least one insert having at least one beveled hole therein, the insert adapted to receive at least one semiconductor device. The apparatus further includes a tray having a pocket for receiving the insert and a slot, a deformable segment on the insert, and at least three posts on the insert. Further included is at least one tab on the deformable segment with one of the slots receiving the tab.