Abstract: Circuitry for measuring a propagation delay in a circuit path. The circuitry includes a one-shot edge triggered element that can be connected in a loop with the circuit path. An edge signal propagating through the circuit path triggers the one-shot element to output a pulse. The pulse propagates around the loop, again triggering the one-shot element to produce a pulse, creating a repeating series of pulses. The period between these pulses is influenced by propagation time of an edge through the loop such that a difference in the period with the circuit path connected and not connected in the loop indicates propagation delay in the circuit path. Such circuitry can be configured to independently measure, and therefore calibrate for, propagation delays associated with rising and falling edges. Calibration to separately equalize propagation delays for rising and falling edges can increase the timing accuracy of an automatic test system.

Abstract: Circuitry for measuring a propagation delay in a circuit path. The circuitry includes a one-shot edge triggered element that can be connected in a loop with the circuit path. An edge signal propagating through the circuit path triggers the one-shot element to output a pulse. The pulse propagates around the loop, again triggering the one-shot element to produce a pulse, creating a repeating series of pulses. The period between these pulses is influenced by propagation time of an edge through the loop such that a difference in the period with the circuit path connected and not connected in the loop indicates propagation delay in the circuit path. Such circuitry can be configured to independently measure, and therefore calibrate for, propagation delays associated with rising and falling edges. Calibration to separately equalize propagation delays for rising and falling edges can increase the timing accuracy of an automatic test system.