Abstract: A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode provides fluorescence spectroscopy and diffraction contrast imaging. The full field transmission mode allows two-dimensional (2-D) imaging and tomography. The nanoprobe instrument includes zone plate optics for focusing and imaging. The nanoprobe instrument includes a stage group for positioning the zone plate optics. The nanoprobe instrument includes a specimen stage group for positioning the specimen. An enhanced laser Doppler displacement meter (LDDM) system provides two-dimensional differential displacement measurement in a range of nanometer resolution between the zone-plate optics and the sample holder. A digital signal processor (DSP) implements a real-time closed-loop feedback technique for providing differential vibration control between the zone-plate optics and the sample holder.

Abstract: An annulus vent valve is provided to vent gas or other production fluids from below a packer set within a well in deep-set applications. The valve may broadly include: a body member having a first end, a second end, an outer surface, a longitudinal bore adjacent the second end, and at least one flow port extending from the longitudinal bore to the outer surface; a closure member mounted within the longitudinal bore to control fluid flow therethrough; a mechanism for biasing the closure member to a normally closed position to prevent fluid flow through the longitudinal bore; a closure member actuator disposed for movement within the longitudinal bore to open and close the closure member; a mechanism for biasing the closure member actuator away from the closure member; a piston connected to the closure member actuator and having a first end and a second end; and a gas chamber disposed within the body member and in communication with the second end of the piston.

Abstract: A non-contact in-situ temperature measurement apparatus for a single crystal substrate such as a semiconductor wafer using X-ray diffraction. Utilizing the Bragg condition for X-ray diffraction, the lattice constant of the semiconductor substrate can be determined either by measuring the diffraction angle for a monochromatic X-ray (monochromatic approach) or by measuring the wavelength of an X-ray diffracted with a certain scattering angle (polychromatic approach). The lattice constant, as a well-known function of temperature, is finally converted into the temperature of the semiconductor substrate.