Patents by Inventor Gregory D. VanWiggeren

Gregory D. VanWiggeren has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6943891
    Abstract: Systems, methods, computer-readable media for determining optical characteristics, such as polarization mode dispersion and/or polarization dependent loss, of device under test (DUTs) are provided. In this regard, one such system includes a response analyzer that receives data corresponding to responses of a DUT to optical signals. The response analyzer computes fast and slow group delays corresponding to at least some of the optical signals, each of the fast and slow group delays being attributable to one of a first and a second principle state of polarization. The response analyzer then assigns each of the fast and slow group delays to a correct one of the first and second principle states of polarization for at least some of the optical signals.
    Type: Grant
    Filed: March 15, 2002
    Date of Patent: September 13, 2005
    Assignee: Agilent Technologies, Inc.
    Inventor: Gregory D. VanWiggeren
  • Patent number: 6941039
    Abstract: The present invention relates to a type of optical fiber grating having an azimuthal refractive-index perturbation. The optical fiber includes a fiber grating that has a plurality of grating elements formed therein. At least one of the grating elements has a spatially varying index of refraction that varies azimuthally about the centerline of the optical fiber. The fiber grating acts as a band-stop optical spectral filter. In addition, since fiber-cladding modes are weakly-guided modes, their power can be easily dissipated by scattering, bending, stretching, and/or rotating the optical fiber. Multiple configurations of these gratings within an optical fiber are given. Devices are presented which can dynamically attenuate, tune, switch, or modulate the wavelength spectral characteristics of an optical signal.
    Type: Grant
    Filed: July 8, 2004
    Date of Patent: September 6, 2005
    Assignee: Georgia Tech Research Corporation
    Inventors: Thomas K Gaylord, Gregory D. VanWiggeren, Donald D. Davis, Elias N. Glytsis, Emmanuel Anemogiannis
  • Patent number: 6914681
    Abstract: A system and method for measuring optical characteristics of an optical device under test (DUT) is provided. The system includes a light source for generating an optical signal applied to the optical DUT. A reference interferometer and a test interferometer are optically coupled to the light source. A computing unit is coupled to the interferometers, and utilizes amplitude and phase computing components, such as orthogonal filters, in determining optical characteristics of the optical DUT.
    Type: Grant
    Filed: August 22, 2001
    Date of Patent: July 5, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Bogdan Szafraniec, Gregory D. Vanwiggeren, Ali Motamedi
  • Patent number: 6900896
    Abstract: A method and system for measuring optical characteristics of a sub-component within a composite optical system is disclosed. In one embodiment, the present invention generates an optical response from a composite optical system. The present embodiment then separates an optical response of a sub-component from the optical response of the composite optical system. The present embodiment then determines the optical characteristics of the sub-component by utilizing at least one portion of the optical response of the sub-component.
    Type: Grant
    Filed: March 15, 2002
    Date of Patent: May 31, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Ali Motamedi, Bogdan Szafraniec, Gregory D. VanWiggeren
  • Patent number: 6882428
    Abstract: A heterodyne optical network analyzer and method for device characterization reduces the effect of relative intensity noise (RIN) in interferometric optical measurements by subtracting the measured intensities of first and second interference signals derived from an optical interferometer. The first and second interference signals are produced by combining a first lightwave transmitted to an optical device being characterized with a second lightwave, which is a delayed version of the first lightwave. The first and second lightwaves are derived by splitting an input lightwave having a continuously swept optical frequency generated by a light source, such as a continuously tunable laser.
    Type: Grant
    Filed: November 27, 2002
    Date of Patent: April 19, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Douglas M. Baney, Gregory D. VanWiggeren, Ali Motamedi
  • Patent number: 6813028
    Abstract: A method and system for calibrating an interferometric optical network analyzer is disclosed. Specifically, a plurality of interferometric measurements for a control optical element using first polarized lightwaves of a first amplitude and second polarized lightwaves of a second amplitude are received in accordance with the invention. Next, a calibration result is derived using the plurality of interferometric measurements in accordance with the present invention. With this calibration result, the optical properties of a device under test (DUT) measured using the first polarized lightwaves of the first amplitude and the second polarized lightwaves of the second amplitude can be determined with reduced uncertainty due to intrinsic optical characteristics of the interferometric optical network analyzer.
    Type: Grant
    Filed: July 25, 2002
    Date of Patent: November 2, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Gregory D. Vanwiggeren
  • Publication number: 20040019445
    Abstract: A method and system for calibrating an interferometric optical network analyzer is disclosed. Specifically, a plurality of interferometric measurements for a control optical element using first polarized lightwaves of a first amplitude and second polarized lightwaves of a second amplitude are received in accordance with the invention. Next, a calibration result is derived using the plurality of interferometric measurements in accordance with the present invention. With this calibration result, the optical properties of a device under test (DUT) measured using the first polarized lightwaves of the first amplitude and the second polarized lightwaves of the second amplitude can be determined with reduced uncertainty due to intrinsic optical characteristics of the interferometric optical network analyzer.
    Type: Application
    Filed: July 25, 2002
    Publication date: January 29, 2004
    Inventor: Gregory D. Vanwiggeren
  • Publication number: 20030223073
    Abstract: By making combined interferometric and polarimetric measurements on a device under test, the relative phase uncertainty in device characterizations performed with a polarimeter or polarization analyzer alone is removed. This allows determination of the group delay to within a constant offset and the chromatic dispersion of the device under test.
    Type: Application
    Filed: May 29, 2002
    Publication date: December 4, 2003
    Inventors: Gregory D. VanWiggeren, Douglas M. Baney
  • Publication number: 20030174337
    Abstract: Systems, methods, computer-readable media for determining optical characteristics, such as polarization mode dispersion and/or polarization dependent loss, of device under test (DUTs) are provided. In this regard, one such system includes a response analyzer that receives data corresponding to responses of a DUT to optical signals. The response analyzer computes fast and slow group delays corresponding to at least some of the optical signals, each of the fast and slow group delays being attributable to one of a first and a second principle state of polarization. The response analyzer then assigns each of the fast and slow group delays to a correct one of the first and second principle states of polarization for at least some of the optical signals.
    Type: Application
    Filed: March 15, 2002
    Publication date: September 18, 2003
    Inventor: Gregory D. VanWiggeren
  • Publication number: 20030112442
    Abstract: A heterodyne optical network analyzer and method for device characterization reduces the effect of relative intensity noise (RIN) in interferometric optical measurements by subtracting the measured intensities of first and second interference signals derived from an optical interferometer. The first and second interference signals are produced by combining a first lightwave transmitted to an optical device being characterized with a second lightwave, which is a delayed version of the first lightwave. The first and second lightwaves are derived by splitting an input lightwave having a continuously swept optical frequency generated by a light source, such as a continuously tunable laser.
    Type: Application
    Filed: November 27, 2002
    Publication date: June 19, 2003
    Inventors: Douglas M. Baney, Gregory D. VanWiggeren, Ali Motamedi
  • Publication number: 20030076556
    Abstract: Optical systems for selectively altering the propagation of light are provided. A representative optical system incorporates an optical device that includes a first para-electric holographic medium. The first para-electric holographic medium stores a first hologram that can exhibit a first active mode. The first hologram exhibits the first active mode when a first electric field is applied to the first para-electric holographic medium. When in the first active mode, the first hologram directs light incident upon the first holographic medium to a first location. Methods and other systems also are provided.
    Type: Application
    Filed: October 24, 2001
    Publication date: April 24, 2003
    Inventors: Gregory D. VanWiggeren, Mark A. Troll, Tun S. Tan, Douglas M. Baney, Jeffrey N. Miller
  • Patent number: 6542668
    Abstract: An apparatus for measuring environmental parameters comprising an optical fiber-based sensor having thermally-induced diffraction gratings therein which are stable at very high temperatures for many hours. The diffraction gratings are, preferably, formed in an optical fiber by exposure to light from an infrared laser and do not degrade at high temperatures. A system for measuring an environmental parameter includes an optical fiber-based sensor, a light source, and a detector. According to a method of measuring an environmental parameter, the optical fiber-based sensor is positioned within a high-temperature environment having a parameter desired for measurement. The light source directs light into the optical fiber-based sensor. The detector measures the differential diffraction of the light output from the optical fiber-based sensor and determines a value of the environmental parameter based, at least in part, upon a known correlation between the differential diffraction and the environmental parameter.
    Type: Grant
    Filed: May 3, 2001
    Date of Patent: April 1, 2003
    Assignee: Georgia Tech Research Corp.
    Inventors: Thomas K. Gaylord, Gregory D. VanWiggeren, Donald D. Davis, Elias N. Glytsis, Emmanuel Anemogiannis
  • Publication number: 20030053069
    Abstract: A method and system for measuring optical characteristics of a sub-component within a composite optical system is disclosed. In one embodiment, the present invention generates an optical response from a composite optical system. The present embodiment then separates an optical response of a sub-component from the optical response of the composite optical system. The present embodiment then determines the optical characteristics of the sub-component by utilizing at least one portion of the optical response of the sub-component.
    Type: Application
    Filed: March 15, 2002
    Publication date: March 20, 2003
    Inventors: Ali Motamedi, Bogdan Szafraniec, Gregory D. VanWiggeren
  • Publication number: 20030053068
    Abstract: A system and method for measuring optical characteristics of an optical device under test (DUT) is provided. The system includes a light source for generating an optical signal applied to the optical DUT. A reference interferometer and a test interferometer are optically coupled to the light source. A computing unit is coupled to the interferometers, and utilizes amplitude and phase computing components, such as orthogonal filters, in determining optical characteristics of the optical DUT.
    Type: Application
    Filed: August 22, 2001
    Publication date: March 20, 2003
    Inventors: Bogdan Szafraniec, Gregory D. Vanwiggeren, Ali Motamedi
  • Publication number: 20010055445
    Abstract: An apparatus for measuring environmental parameters comprising an optical fiber-based sensor having thermally-induced diffraction gratings therein which are stable at very high temperatures for many hours. The diffraction gratings are, preferably, formed in an optical fiber by exposure to light from an infrared laser and do not degrade at high temperatures. A system for measuring an environmental parameter includes an optical fiber-based sensor, a light source, and a detector. According to a method of measuring an environmental parameter, the optical fiber-based sensor is positioned within a high-temperature environment having a parameter desired for measurement. The light source directs light into the optical fiber-based sensor. The detector measures the differential diffraction of the light output from the optical fiber-based sensor and determines a value of the environmental parameter based, at least in part, upon a known correlation between the differential diffraction and the environmental parameter.
    Type: Application
    Filed: May 3, 2001
    Publication date: December 27, 2001
    Inventors: Thomas K. Gaylord, Gregory D. VanWiggeren, Donald D. Davis, Elias N. Glytsis, Emmanuel Anemogiannis