Patents by Inventor Gregory E. Poirier

Gregory E. Poirier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Atomic force microscope using piezoelectric detection
    Patent number: 5574278
    Abstract: A method and apparatus detects surface properties of a sample surface using n atomic force microscope. The atomic force microscope includes a piezoelectric tube mounted on a rigid surface and separated into actuator and sensor segments. The sensor segments detect interatomic force information without snap-in effects common with cantilever mounts. A probe tip is mounted on the sensor section of the piezoelectric tube. The probe tip interacts with the interatomic forces of the sample surface. Supporting circuitry is used in either current feedback or force feedback modes.
    Type: Grant
    Filed: May 23, 1995
    Date of Patent: November 12, 1996
    Assignee: The United States of America as represented by the Secretary of Commerce
    Inventor: Gregory E. Poirier