Patents by Inventor Gregory K. Pribil

Gregory K. Pribil has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use
    Patent number: 10073120
    Abstract: Optical Hall Effect (OHE) method for evaluating such as free charge carrier effective mass, concentration, mobility and free charge carrier type in a sample utilizing a permanent magnet at room temperature.
    Type: Grant
    Filed: October 13, 2017
    Date of Patent: September 11, 2018
    Assignees: BOARD OF REGENTS FOR THE UNIVERSITY OF NEBRASKA, J.A. WOOLLAM CO., INC.
    Inventors: Tino Hofmann, Mathias M. Schubert, Stefan Schoeche, Philipp Kuehne, Craig M. Herzinger, John A. Woollam, Gregory K. Pribil, Thomas E. Tiwald, Sean R. Knight
  • Elliposometer system with polarization state generator and polarization state analyzer in environmental chamber
    Patent number: 9933357
    Abstract: An ellipsometer system with polarization state generator and polarization state analyzer components inside at least one internal environment supporting encasement, said at least one encasement being present inside said environmental chamber.
    Type: Grant
    Filed: February 3, 2017
    Date of Patent: April 3, 2018
    Assignee: J. A. WOOLLAM CO., INC.
    Inventors: Ping He, Gregory K. Pribil, Martin M. Liphardt
  • Non-destructive approach to ellipsometric monitoring of a film coating on the inner surface of a tube shaped sample
    Patent number: 7768660
    Abstract: Disclosed is the use of a focused electromagnetic beam which is caused to impinge on the top surface of a tube shaped sample, to investigate a film coating on its inner surface during fabrication thereof and/or thereafter.
    Type: Grant
    Filed: August 30, 2007
    Date of Patent: August 3, 2010
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Gregory K. Pribil, John A. Woollam, Martin M. Liphardt, James D. Welch
  • Sample analysis methodology utilizing electromagnetic radiation
    Patent number: 7385697
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Grant
    Filed: May 20, 2004
    Date of Patent: June 10, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker
  • Accurate determination of refractive indices of solid, fluid and liquid materials
    Patent number: 7280194
    Abstract: Systems and methodology for determining not only precise and repeatable results, but accurate values of the refractive index of solids, fluids and liquids.
    Type: Grant
    Filed: November 30, 2004
    Date of Patent: October 9, 2007
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Craig M. Herzinger, Steven E. Green, Gregory K. Pribil
  • Ellipsometer or polarimeter and the like system with multiple detector element detector in environmental control chamber including secure sample access
    Patent number: 7253900
    Abstract: A spectrophotometer, ellipsometer or polarimeter or the like system with a spectroscopic source of wavelengths and a detector with multiple detector elements for simultaneous monitoring of a number of wavelengths in an environmental control chamber which optionally provides for secured sample entry, and methodology of use.
    Type: Grant
    Filed: October 9, 2004
    Date of Patent: August 7, 2007
    Assignee: J.A. Woollam Co., Inc.
    Inventors: John A. Woollam, Gregory K. Pribil, Martin M. Liphardt, James D. Welch
  • Dielectric function of thin metal films determined by combined transmission spectroscopic ellipsometry and intensity measurements
    Patent number: 7167241
    Abstract: Determination of thin metal film dielectric function and layer thicknesses using simultaneous transmission spectroscopic ellipsometric (SE) and transmission intensity (T) measurements obtained in-situ to break correlation between thickness and optical constants of very thin absorbing films, preferably using only A.C. Components of ellipsometric and intensity characterizing electromagnetic radiation which transmits through said substrate and enters a detector.
    Type: Grant
    Filed: July 4, 2004
    Date of Patent: January 23, 2007
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Blaine D. Johs, Gregory K. Pribil
  • Sample analysis methodology utilizing electromagnetic radiation
    Publication number: 20040257567
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Application
    Filed: May 20, 2004
    Publication date: December 23, 2004
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker