Patents by Inventor Gregory Katzmann

Gregory Katzmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for spectrometry
    Patent number: 11133168
    Abstract: The invention relates to a method for the spectrometry, in particular mass spectrometry, ion-mobility spectrometry, or optical emission spectroscopy, of a sample, comprising the following steps: providing a solid-state generator for generating a high-frequency signal, having a control element for varying the power and/or frequency of the signal, providing a plasma ignition head fed by the signal for generating a plasma jet, applying the plasma jet to a sample, performing a first measuring operation, wherein the plasma jet is generated with a first power of the solid-state generator and a spectrum emitted by the sample, preferably charged ions and/or optical spectrum, is recorded by means of a spectrometer, wherein the first power leads to a soft ionization of the sample, and performing a second measuring operation on the same sample, wherein the plasma jet is generated with a second power of the solid-state generator and a spectrum emitted by the sample, preferably charged atoms and/or optical spectrum, is re
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: September 28, 2021
    Assignee: UNIVERSITY OF BASEL
    Inventor: Gregory Katzmann
  • METHOD FOR SPECTROMETRY
    Publication number: 20190318920
    Abstract: The invention relates to a method for the spectrometry, in particular mass spectrometry, ion-mobility spectrometry, or optical emission spectroscopy, of a sample, comprising the following steps: providing a solid-state generator for generating a high-frequency signal, having a control element for varying the power and/or frequency of the signal, providing a plasma ignition head fed by the signal for generating a plasma jet, applying the plasma jet to a sample, performing a first measuring operation, wherein the plasma jet is generated with a first power of the solid-state generator and a spectrum emitted by the sample, preferably charged ions and/or optical spectrum, is recorded by means of a spectrometer, wherein the first power leads to a soft ionization of the sample, and performing a second measuring operation on the same sample, wherein the plasma jet is generated with a second power of the solid-state generator and a spectrum emitted by the sample, preferably charged atoms and/or optical spectrum, is re
    Type: Application
    Filed: October 26, 2017
    Publication date: October 17, 2019
    Inventor: Gregory Katzmann