Abstract: Temperature programmed spectroscopy wherein particles of a substrate under investigation are attached in a non-overlapping manner to a heating filament. The temperature of the filament is increased in a controlled manner, thus increasing the temperature of the attached substrate particles as well. An instrument for analyzing the gases is a mass spectrometer. Gases desorbed from the particles can be studied according to this technique, or the nature of heterogeneous catalytic chemical reactions of a gaseous atmosphere on the particles' surface may alternativelRIGHTS OF THE U.S. GOVERNMENTThe invention described herein may be manufactured and used by or for the Government of the United States without the payment of any royalties thereon or therefor.

Abstract: Temperature programmed spectroscopy wherein particles of a substrate under investigation are attached in a non-overlapping manner to a heating filament. The temperature of the filament is increased in a controlled manner, thus increasing the temperature of the attached substrate particles as well. An instrument for analyzing the gases is a mass spectrometer. Gases desorbed from the particles can be studied according to this technique, or the nature of heterogeneous catalytic chemical reactions of a gaseous atmosphere on the particles' surface may alternatively be detected and studied.