Patents by Inventor Gregory Martin Quick

Gregory Martin Quick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and methods of generating a test pattern of data, analysing a test pattern of data, and testing a data storage disk medium and/or a read/write head
    Patent number: 8120867
    Abstract: A method of generating a test pattern of data to be written to a data storage disk medium for testing includes: rotating the disk; detecting fluctuations in the speed of rotation of the disk; producing a reference clock signal in accordance with the fluctuations so as to be synchronized with the rotation of the disk; and, generating a test pattern of data using the reference clock signal as a timing reference. An apparatus for generating a test pattern of data includes a spindle for rotating a disk; a detector arranged to detect fluctuations in the speed of rotation of the disk; a processor arranged to produce a reference clock signal in accordance with fluctuations so as to be synchronized with the rotation of the disk; and, a pattern generator arranged to generate a test pattern of data using the reference clock signal as a timing reference.
    Type: Grant
    Filed: May 15, 2008
    Date of Patent: February 21, 2012
    Assignees: Xyratex Technology Limited, Seagate Technology LLC
    Inventors: Keith Rowland Charles Brady, Gregory Martin Quick, Paul Harvey Ronald Jolly
  • APPARATUS AND METHODS OF GENERATING A TEST PATTERN OF DATA, ANALYSING A TEST PATTERN OF DATA, AND TESTING A DATA STORAGE DISK MEDIUM AND/OR A READ/WRITE HEAD
    Publication number: 20110032631
    Abstract: A method of generating a test pattern of data to be written to a data storage disk medium for testing includes: rotating the disk; detecting fluctuations in the speed of rotation of the disk; producing a reference clock signal in accordance with the fluctuations so as to be synchronised with the rotation of the disk; and, generating a test pattern of data using the reference clock signal as a timing reference. An apparatus for generating a test pattern of data includes a spindle for rotating a disk; a detector arranged to detect fluctuations in the speed of rotation of the disk; a processor arranged to produce a reference clock signal in accordance with fluctuations so as to be synchronised with the rotation of the disk; and, a pattern generator arranged to generate a test pattern of data using the reference clock signal as a timing reference.
    Type: Application
    Filed: May 15, 2008
    Publication date: February 10, 2011
    Applicants: XYRATEX TECHNOLOGY LIMITED, SEAGATE TECHNOLOGY LLC
    Inventors: Keith Rowland Charles Brady, Gregory Martin Quick, Paul Harvey Ronald Jolly