Abstract: Embodiments described herein may be related to apparatuses, processes, systems, and/or techniques for using x-rays to alter or observe circuits within a semiconductor device before, during or after a test of the semiconductor device. Other embodiments may be described and/or claimed.

Abstract: A probe assembly for analyzing a test device that includes a housing with an electron source disposed therein for emitting primary electrons. A photon source is positioned to emit photons that strike the electron source such that when the photons strike the electron source, the electron source emits the primary electrons. Detection circuitry is provided that is configured to detect secondary electrons emitted from a test device of a test assembly and to form an excitation waveform.

Abstract: System for allowing a user, by use of a remote controller, to control the operation of appliances located in different sub-environments of an environment, that comprises a plurality of sub-environments' recognition means, each one is allocated to a respective sub-environment and equipped with a code unique to the respective sub-environment; and a remote controller, configured to obtain from the recognition means location signal that contains the unique code to recognize the sub-environment the controller is currently in. The controller introduces to the user, in response to the recognition of a sub-environment, control options relevant only to appliances that are located in the recognized sub-environment. The controller includes user interaction means to allow the user to activate the control options, as desired by him.