Patents by Inventor Gregory P. Chema

Gregory P. Chema has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7324932
    Abstract: A method of and an apparatus for designing a test environment providing reliable test signal integrity, and of evaluating performance of the test environment and an electronic device during testing of the electronic device. A virtual test environment is created emulating an actual test environment in which the electronic device is to be tested. A virtual calibration of the virtual test environment may be performed, to more closely emulate the actual test environment. A virtual device emulating the actual electronic device is implanted into the virtual test environment, and that virtual device is stimulated with an input test signal emulating the actual input signal that is applied to the actual electronic device in the actual test environment. The integrity of the input test signal and the resulting output signal is evaluated.
    Type: Grant
    Filed: June 28, 2005
    Date of Patent: January 29, 2008
    Assignee: Intel Corporation
    Inventors: Sunil K. Jain, Gregory P. Chema
  • Patent number: 6934670
    Abstract: A method of and an apparatus for designing a test environment and of evaluating performance of the test environment and an electronic device during testing of the electronic device. A virtual test environment is created emulating an actual test environment. A virtual device emulating the actual electronic device is implanted into the virtual test environment, and that virtual device is stimulated with an input test signal emulating the actual input signal applied to the actual electronic device in the actual test environment. The integrity of the input test signal and the resulting output signal is evaluated. An adjustment might be made to the virtual calibration of the virtual test environment and/or to the virtual device, or both, and the design of the actual device might be improved. The invention can be implemented on a properly programmed general purpose processing system or on a special purpose system.
    Type: Grant
    Filed: March 30, 2001
    Date of Patent: August 23, 2005
    Assignee: Intel Corporation
    Inventors: Sunil K. Jain, Gregory P. Chema
  • Patent number: 6898746
    Abstract: Testing of a mixed signal electronic device, and evaluating of a test environment. A test driver applies an input test signal to the device. The response of the device is monitored on a differential monitoring device to obtain analog data and on a tester receiver to obtain digital data. The analog data and the digital data are processed, the processed data are compared and evaluated, and the device is evaluted. A virtual test environment is created emulating an actual test environment, and a virtual device emulating the actual device is created and is stimulated with an input test signal emulating an actual input signal. The response of the virtual device is monitored to obtain analog data and digital data. The analog data and the digital data are processed, the processed analog and digital data are compared and evaluated, and the virtual device is evaluated.
    Type: Grant
    Filed: June 19, 2001
    Date of Patent: May 24, 2005
    Assignee: Intel Corporation
    Inventors: Sunil K. Jain, Gregory P. Chema
  • Publication number: 20020194560
    Abstract: Testing of a mixed signal electronic device, and evaluating of a test environment. A test driver applies an input test signal to the device. The response of the device is monitored on a differential monitoring device to obtain analog data and on a tester receiver to obtain digital data. The analog data and the digital data are processed, the processed data are compared and evaluated, and the device is evaluted. A virtual test environment is created emulating an actual test environment, and a virtual device emulating the actual device is created and is stimulated with an input test signal emulating an actual input signal. The response of the virtual device is monitored to obtain analog data and digital data. The analog data and the digital data are processed, the processed analog and digital data are compared and evaluated, and the virtual device is evaluated.
    Type: Application
    Filed: June 19, 2001
    Publication date: December 19, 2002
    Inventors: Sunil K. Jain, Gregory P. Chema
  • Publication number: 20020143519
    Abstract: A method of and an apparatus for designing a test environment and of evaluating performance of the test environment and an electronic device during testing of the electronic device. A virtual test environment is created emulating an actual test environment. A virtual device emulating the actual electronic device is implanted into the virtual test environment, and that virtual device is stimulated with an input test signal emulating the actual input signal applied to the actual electronic device in the actual test environment. The integrity of the input test signal and the resulting output signal is evaluated. An adjustment might be made to the virtual calibration of the virtual test environment and/or to the virtual device, or both, and the design of the actual device might be improved. The invention can be implemented on a properly programmed general purpose processing system or on a special purpose system.
    Type: Application
    Filed: March 30, 2001
    Publication date: October 3, 2002
    Inventors: Sunil K. Jain, Gregory P. Chema