Patents by Inventor Gregory P. Hackney

Gregory P. Hackney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10534880
    Abstract: Aspects of the disclosed technology relate to techniques of voltage propagation-based reliability verification. Voltage values are propagated across components of a circuit design through global iterations until voltage values on nets of the circuit design are not changed from one global iteration to a next global iteration or one preset condition is met. At least one of the global iterations comprises local iterations for a subcircuit of the circuit design. The local iterations suspend when voltage values on nets of the subcircuit are not changed from one local iteration to a next local iteration or one preset condition is met. The propagated voltage values are then analyzed to detect problems in the circuit design.
    Type: Grant
    Filed: August 17, 2016
    Date of Patent: January 14, 2020
    Assignee: Mentor Graphics Corporation
    Inventors: Mark E. Hofmann, Sridhar Srinivasan, Gregory P. Hackney
  • Publication number: 20180052951
    Abstract: Aspects of the disclosed technology relate to techniques of voltage propagation-based reliability verification. A circuit design is analyzed to identify circuit component chains. Voltage values are propagated across components of the circuit design based, at least in part, on treating the circuit component chains as virtual single components. The propagated voltage values are analyzed to detect problems in the circuit design.
    Type: Application
    Filed: August 17, 2016
    Publication date: February 22, 2018
    Inventors: Mark E. Hofmann, Sridhar Srinivasan, Gregory P. Hackney
  • Publication number: 20180052950
    Abstract: Aspects of the disclosed technology relate to techniques of voltage propagation-based reliability verification. Voltage values are propagated across components of a circuit design through global iterations until voltage values on nets of the circuit design are not changed from one global iteration to a next global iteration or one preset condition is met. At least one of the global iterations comprises local iterations for a subcircuit of the circuit design. The local iterations suspend when voltage values on nets of the subcircuit are not changed from one local iteration to a next local iteration or one preset condition is met. The propagated voltage values are then analyzed to detect problems in the circuit design.
    Type: Application
    Filed: August 17, 2016
    Publication date: February 22, 2018
    Inventors: Mark E. Hofmann, Sridhar Srinivasan, Gregory P. Hackney
  • Publication number: 20130318487
    Abstract: Techniques for analysis of an electrical circuit design are described, which techniques employ two phases: an initialization phase, and a check phase. During the initialization phase, a circuit design is examined to determine the predicted operating characteristics at various nodes within the design. If the design is hierarchically arranged, then the design is analyzed in a way that preserves its hierarchy. During the check phase, various implementations of the invention will check the determined operating characteristic values to see if they indicate that one or more design rules have been violated. A user may specify or “program” aspects of the analysis, both for the initialization phase and the check phase.
    Type: Application
    Filed: May 23, 2013
    Publication date: November 28, 2013
    Applicant: Mentor Graphics Corporation
    Inventors: Gregory P. Hackney, Mark E. Hofmann, Ziyang Lu, Dina Medhat
  • Patent number: 5046033
    Abstract: The present system is employed to generate and transmit information which is needed to construct or assemble truth tables and pertinent data which are directed to associated circuits which require testing. The present method employs a technique whereby information is nested, or compacted, in accordance with certain rules of grammar and is transmitted from a circuit design group to a vendor, i.e., a manufacturer of the circuit designed by a design group. When the nested information is expanded by a translator device, or by a translation program, at the manufactuer's location, it is directly expandable into truth table information for use by various logic testers. Each of the truth tables defines a specific function that the designer wants tested in the associated circuit. The manufacturer supplies the test platform hardware which generates the desired signal patterns defined by the truth table information and pertinent data.
    Type: Grant
    Filed: August 9, 1989
    Date of Patent: September 3, 1991
    Assignee: Unisys Corporation
    Inventors: David A. Andreasen, Dean J. Shea, Gregory P. Hackney