Abstract: The present invention provides an efficient and economical method for reducing carryover contamination in an amplification procedure. The method of the present invention enables background caused by contaminant amplification product to be reduced or eliminated through the incorporation of at least one modification into the amplification product. The modified amplification product is readily distinguishable from the target sequence in a test sample. Prior to amplifying the target in a new test sample, the sample may be treated to selectively eliminate the contaminant amplification product so that it cannot be amplified in the new sample.

Abstract: The present invention provides an efficient and economical method for reducing carryover contamination in an amplification procedure. The method of the present invention enables background caused by contaminant amplification product to be reduced or eliminated through the incorporation of at least one modification into the amplification product. The modified amplification product is readily distinguishable from the target sequence in a test sample. Prior to amplifying the target in a new test sample, the sample may be treated to selectively cleave the contaminant amplification product so that it cannot be amplified in the new sample.

Abstract: A member has two (2) spring arms each movable between first and second positions. Each spring arm is normally biased to a first position and is movable to a second position. Each spring arm has at its free end an insulator and a conductor disposed on the insulator. The insulator isolates the conductor electrically from the associated spring arm. An electrical lead is connected between the conductors. In the first position of the spring arms, the electrical conductors engage individual ones of a pair of probes and establish common probe potentials. Each probe is disposed coaxially in an insulator in an individual one of a pair of electrical connectors and the insulator is disposed coaxially in a casing in the connector. The probe extends axially beyond the insulator and the casing in each connector so that the associated electrical conductor is able to engage the probe in that connector in the first position of the spring arm.