Abstract: A computer-implemented method for estimating noise adjustments in an integrated circuit design includes computing a first noise impact on timing calculation including a first slew rate and a first delay due to coupled noise prior to a physical design change; computing a second slew rate after the physical design change; and computing a second noise impact on a timing calculation based on the first delay and a ratio of the second slew rate and the first slew rate.

Abstract: Predicting failure in a circuit design caused by noise impact including receiving, for a net representing the circuit design and including at least one of a source or a sink gate, data for a specified feature set; predicting a failure related to noise impact including induced switching of the net based on the data for the specified feature set and using noise tolerance information; upon receiving the prediction, modifying the net using the predicted failure information; and after modifying the net using the predicted failure information, re-predicting a failure related to noise impact including induced switching of the net based on updated data for the specified feature set and using noise tolerance information; and upon receiving the updated prediction, modifying the net using the updated predicted failure information.

Abstract: To increase the efficiency of electronic design automation, in a putative electronic logic circuit design, at least one transparent latch is identified as a candidate for slack stealing. An initial timing slack, available for stealing, and associated with the at least one transparent latch, is determined. Responsive to a determination that the initial timing slack available for stealing is insufficient, it is determined whether the initial timing slack available for stealing is on a feedback path. If so, responsive to determining that the initial timing slack available for stealing is on the feedback path, the initial timing slack available for stealing is replaced with a next worse slack.

Abstract: To increase the efficiency of electronic design automation, in a putative electronic logic circuit design, at least one transparent latch is identified as a candidate for slack stealing. An initial timing slack, available for stealing, and associated with the at least one transparent latch, is determined. Responsive to a determination that the initial timing slack available for stealing is insufficient, it is determined whether the initial timing slack available for stealing is on a feedback path. If so, responsive to determining that the initial timing slack available for stealing is on the feedback path, the initial timing slack available for stealing is replaced with a next worse slack.

Abstract: Efficiency of electronic design automation is increased by accessing a data structure characterizing a hierarchical integrated circuit design including sub-blocks each with a plurality of ports. For each given one of the ports of each of the sub-blocks, obtain a wire specification for a corresponding net connected to the given one of the ports in the design, and based on the wire specification, consult a technology-specific lookup table to determine at least one of a corresponding default driving cell and default electrical model for an external wire coupling one of the default driving cell and an actual driving cell to the given one of the ports. Optimize each of the sub-blocks out-of-context based on the at least one of default driving cells and default electrical models; verify in-context closure for the optimized sub-blocks; and, responsive to the in-context closure, update the data structure to reflect the optimized sub-blocks.

Abstract: A system and method to perform timing analysis in integrated circuit development involves defining an integrated circuit design as nodes representing components of the integrated circuit design that are interconnected by edges representing wires. Sequentially connected nodes define a path. Statistical variables are defined for a canonical delay model of each node and edge of the integrated circuit design and define a first set of conditions. The method includes performing a statistical static timing analysis to obtain an arrival time at each node as a sum of the canonical delay models for nodes and edges that precede the node in the path of the node, obtaining a projected arrival time at a second set of conditions for the node by scaling the arrival time for the node using scale factors that represent the second set of conditions and using a transformation matrix, and providing the integrated circuit design for fabrication.

Abstract: A system and method to perform timing analysis in integrated circuit development involves defining an integrated circuit design as nodes representing components of the integrated circuit design that are interconnected by edges representing wires. Sequentially connected nodes define a path. Statistical variables are defined for a canonical delay model of each node and edge of the integrated circuit design and define a first set of conditions. The method includes performing a statistical static timing analysis to obtain an arrival time at each node as a sum of the canonical delay models for nodes and edges that precede the node in the path of the node, obtaining a projected arrival time at a second set of conditions for the node by scaling the arrival time for the node using scale factors that represent the second set of conditions and using a transformation matrix, and providing the integrated circuit design for fabrication.

Abstract: A method for computing a Miller-factor compensated for peak noise is provided. The method includes mapping at least two delays as a function of at least two Miller-factors; determining an equation of the function; computing a peak noise; computing a peak delay resulting from the peak noise; and computing the compensated Miller-factor based on the equation and the peak delay. The function can be either a linear function or a non-linear function.

Abstract: A system and method of performing microelectronic chip timing analysis, wherein the method comprises identifying failing timing paths in a chip; prioritizing the failing timing paths in the chip according to a size of random noise events occurring in each timing path; attributing a slack credit statistic for all but highest order random noise events occurring in each timing path; and calculating a worst case timing path scenario based on the prioritized failing timing paths and the slack credit statistic. Preferably, the random noise events comprise non-clock events. Moreover, the random noise events may comprise victim/aggressor net groups belonging to different regularity groups. Preferably, the size of random noise events comprises coupled noise delta delays due to the random noise events occurring in the chip.