Patents by Inventor Gregory W. Achilles

Gregory W. Achilles has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for testing data lines
    Patent number: 6925588
    Abstract: Systems and methods for testing data lines to determine signal degradation in the data lines. A system includes a signal generator for generating a test pattern and for transferring the test pattern through the data lines. The system also includes an analyzer communicatively connected to the data lines to determine degradation of the test pattern in the data lines. The signal generator generates and transfers a first test pattern through the data lines. The first test pattern includes a first portion having a first polarity and a second portion having a second polarity. The signal generator then generates and transfers a second test pattern through the data lines in response to transferring the first test pattern. The test patterns may be repeated one or more times to determine cross talk caused by inductive coupling between data lines and additive reflections.
    Type: Grant
    Filed: December 23, 2002
    Date of Patent: August 2, 2005
    Assignee: LSI Logic Corporation
    Inventors: G. Keith Grimes, Gregory W. Achilles
  • Methods and apparatus for testing data lines
    Publication number: 20040123204
    Abstract: Systems and methods for testing data lines to determine signal degradation in the data lines. A system includes a signal generator for generating a test pattern and for transferring the test pattern through the data lines. The system also includes an analyzer communicatively connected to the data lines to determine degradation of the test pattern in the data lines. The signal generator generates and transfers a first test pattern through the data lines. The first test pattern includes a first portion having a first polarity and a second portion having a second polarity. The signal generator then generates and transfers a second test pattern through the data lines in response to transferring the first test pattern. The test patterns may be repeated one or more times to determine cross talk caused by inductive coupling between data lines and additive reflections.
    Type: Application
    Filed: December 23, 2002
    Publication date: June 24, 2004
    Inventors: G. Keith Grimes, Gregory W. Achilles