Abstract: A system for preventing collisions between components in a particle beam instrument is disclosed. The system is particularly beneficial in use with instruments wherein moveable components are used within a chamber that obscures them from being viewed from outside the chamber. The system comprises: a capacitance sensor configured to monitor the capacitance between a first component and a second component of the instrument, and a proximity module configured to: derive a capacitance parameter from the monitored capacitance between the first component and the second component; and output a proximity alert signal in accordance with a comparison between the derived capacitance parameter and a predetermined capacitance parameter threshold value.

Abstract: A system for preventing collisions between components in a particle beam instrument is disclosed. The system is particularly beneficial in use with instruments wherein moveable components are used within a chamber that obscures them from being viewed from outside the chamber. The system comprises: a capacitance sensor configured to monitor the capacitance between a first component and a second component of the instrument, and a proximity module configured to: derive a capacitance parameter from the monitored capacitance between the first component and the second component; and output a proximity alert signal in accordance with a comparison between the derived capacitance parameter and a predetermined capacitance parameter threshold value.

Abstract: A system for preventing collisions between components in a particle beam instrument is disclosed. The system is particularly beneficial in use with instruments wherein moveable components are used within a chamber that obscures them from being viewed from outside the chamber. The system comprises: a capacitance sensor configured to monitor the capacitance between a first component and a second component of the instrument, and a proximity module configured to: derive a capacitance parameter from the monitored capacitance between the first component and the second component; and output a proximity alert signal in accordance with a comparison between the derived capacitance parameter and a predetermined capacitance parameter threshold value.

Abstract: A system for preventing collisions between components in a particle beam instrument is disclosed. The system is particularly beneficial in use with instruments wherein moveable components are used within a chamber that obscures them from being viewed from outside the chamber. The system comprises: a capacitance sensor configured to monitor the capacitance between a first component and a second component of the instrument, and a proximity module configured to: derive a capacitance parameter from the monitored capacitance between the first component and the second component; and output a proximity alert signal in accordance with a comparison between the derived capacitance parameter and a predetermined capacitance parameter threshold value.

Abstract: A semiconductor detector device comprises a layer of semiconductor material for generating charge in response to an input event and an array of pixels for collecting charge. Tracks are connected to the pixels to supply signals representing the collected charge to a reader circuit. The pixels are grouped into sets, all the pixels within a set being connected to the same track, the sets of pixels being interwoven so that so that any group of n adjacent pixels capable of collecting charge generated by a single input event is connected to a combination of n tracks that is unique to the group of pixels, where n has a value of one of 2, 3 or 4. This allows detection of position of the area of charge collection on the basis of temporally coincident signals on a combination of at least n tracks.

Abstract: An active pixel image sensor comprises a pixel array of active pixels that are capable of being random access addressed to provide pixel readout signals from the addressed pixels on N output lines, where N is a plural integer and M ADC lanes capable of performing analog-to-digital conversion of pixel readout signals, where M is a plural integer less than N. A switching arrangement is capable of selectively connecting output lines to the M ADC lanes. A control unit provides random access addressing of the pixels, and in synchronisation therewith controls the switching arrangement to connect the output lines on which the addressed pixels provide pixel readout signals to ADC lanes.

Abstract: An active pixel image sensor comprises a pixel array of active pixels that are capable of being random access addressed to provide pixel readout signals from the addressed pixels on N output lines, where N is a plural integer and M ADC lanes capable of performing analog-to-digital conversion of pixel readout signals, where M is a plural integer less than N. A switching arrangement is capable of selectively connecting output lines to the M ADC lanes. A control unit provides random access addressing of the pixels, and in synchronisation therewith controls the switching arrangement to connect the output lines on which the addressed pixels provide pixel readout signals to ADC lanes.

Abstract: A semiconductor detector device comprises a layer of semiconductor material for generating charge in response to an input event and an array of pixels for collecting charge. Tracks are connected to the pixels to supply signals representing the collected charge to a reader circuit. The pixels are grouped into sets, all the pixels within a set being connected to the same track, the sets of pixels being interwoven so that so that any group of n adjacent pixels capable of collecting charge generated by a single input event is connected to a combination of n tracks that is unique to the group of pixels, where n has a value of one of 2, 3 or 4. This allows detection of position of the area of charge collection on the basis of temporally coincident signals on a combination of at least n tracks.