Abstract: Techniques and corresponding circuitry are presented for the detection of broken wordlines in a memory array. In an exemplary embodiment, a program operation of the memory circuit is performed on a first plurality of memory cells along a word-line, where the programming operation includes a series of alternating programming pulses and verify operations, with the memory cells individually locking out from further programming pulses as verified. The determination of whether the word-line is defective based on the number of programming pulses for the memory cells of a first subset of the first plurality to verify as programmed relative to the number of programming pulses for the memory cells of a second subset of the first plurality to verify as programmed, where the first and second subsets each contain multiple memory cells and are not the same.

Abstract: In a nonvolatile memory array, data is stored in multi-level cells (MLC) as upper-page data and lower-page data. Safe copies of both upper-page and lower-page data are stored in on-chip cache during programming. If a write fail occurs, data is recovered from on-chip cache. The controller does not have to maintain safe copies of data.

Abstract: In a nonvolatile memory system, data received from a host by a memory controller is transferred to an on-chip cache, and new data from the host displaces the previous data before it is written to the nonvolatile memory array. A safe copy is maintained in on-chip cache so that if a program failure occurs, the data can be recovered and written to an alternative location in the nonvolatile memory array.

Abstract: Techniques and corresponding circuitry are presented for the detection of broken wordlines in a memory array. In an exemplary embodiment, a program operation of the memory circuit is performed on a first plurality of memory cells along a word-line, where the programming operation includes a series of alternating programming pulses and verify operations, with the memory cells individually locking out from further programming pulses as verified. The determination of whether the word-line is defective based on the number of programming pulses for the memory cells of a first subset of the first plurality to verify as programmed relative to the number of programming pulses for the memory cells of a second subset of the first plurality to verify as programmed, where the first and second subsets each contain multiple memory cells and are not the same.

Abstract: In a nonvolatile memory system, data received from a host by a memory controller is transferred to an on-chip cache, and new data from the host displaces the previous data before it is written to the nonvolatile memory array. A safe copy is maintained in on-chip cache so that if a program failure occurs, the data can be recovered and written to an alternative location in the nonvolatile memory array.

Abstract: In a nonvolatile memory array, data is stored in multi-level cells (MLC) as upper-page data and lower-page data. Safe copies of both upper-page and lower-page data are stored in on-chip cache during programming. If a write fail occurs, data is recovered from on-chip cache. The controller does not have to maintain safe copies of data.