Abstract: Prioritizing resource allocation to computer applications which includes: grouping the computer applications into groups according to an initial criteria; modifying the groups according to one or more criteria used to identify active computer applications; analyzing the groups to prioritize the groups in order of the active time of the computer applications in the groups; analyzing the computer applications in the groups to prioritize the computer applications in the groups in order of the active time of the computer applications in the groups; setting the highest priority for the computer applications that either (1) have high frequency of use, or (1) are active now; and prioritizing the computer applications according to the priority setting.

Abstract: System and method for controlling test flow of a radio frequency (RF) signal transceiver device under test (DUT) by inducing an interrupt via an internal signal interface or an external signal interface (with one example of the latter being a baseband signal interface for conveying audio signals). With exemplary embodiments, one or more DUT control signals are provided to or otherwise initiated within the DUT by inducing an interrupt, including inducement via use of the signal interface. With further exemplary embodiments, one or more test control signals are also provided to RF circuitry that responds by transmitting one or more RF receive signals for the DUT and receives from the DUT one or more RF transmit signals related to the one or more DUT control signals.

Abstract: Prioritizing resource allocation to computer applications which includes: grouping the computer applications into groups according to an initial criteria; modifying the groups according to one or more criteria used to identify active computer applications; analyzing the groups to prioritize the groups in order of the active time of the computer applications in the groups; analyzing the computer applications in the groups to prioritize the computer applications in the groups in order of the active time of the computer applications in the groups; setting the highest priority for the computer applications that either (1) have high frequency of use, or (1) are active now; and prioritizing the computer applications according to the priority setting.

Abstract: A method for using a test data packet signal to test a data packet signal transceiver device under test (DUT) having an operating characteristic defined by a data packet error rate (PER) as a function of data packet signal power (PWR). The test data packet signal power is varied and a test PER is computed as a function of DUT response data packets and test data packets until a measured test PER or a computed test PER extrapolated from measured PERs is equal to a predetermined PER less than and greater than maximum and minimum PERs, respectively.

Abstract: Method for testing implicit beamforming performance of a multiple-input multiple-output (MIMO) radio frequency (RF) data packet signal transceiver device under test (DUT). The data packet signals forming the sequential data packet signal transmissions used for beamforming are produced with a selectively varied phase difference and conveyed via internal RF signal paths to external transmit terminals. Combining these transmitted data packet signals produces a combined data packet signal in which a peak power occurs during which a particular phase difference is being induced between the sequential DUT data packet signal transmissions used for the beamforming. This phase difference corresponds to the difference in RF signal phase lengths between the internal RF signal paths of the DUT, and is thereby indicative of the amount of phase shift needed between the sequential DUT data packet signal transmissions used for the beamforming to enable optimal implicit beamforming performance.

Abstract: A bonding structure includes a first connecting part, a second connecting part and an adhesive. The first connecting part includes a top surface and a first joining surface opposite to the top surface. The second connecting part includes a mounting surface and defines a bonding groove on the mounting surface, the second connecting part further includes positioning members in the bonding groove. The adhesive is received in the bonding groove of the second connecting part, then the first connecting part is received in the bonding groove. The first joining surface is supported by the positioning members to position the first connecting part, the adhesive is located between the first joining surface and a bottom of the bonding groove to join the first and the second connecting part together. The present disclosure further discloses an electronic device using the bonding structure.

Abstract: A method of testing, such as for a bit error rate (BER), of multiple data packet signal transceivers during which a tester and the data packet signal transceivers exchange sequences of test data packets and summary data packets. The tester provides the test data packets which contain respective pluralities of data bits with respective predetermined bit patterns. Responsive thereto, the data packet signal transceivers provide the summary data packets which contain respective summary data indicative of the number of data bits with the respective predetermined bit patterns that are correctly received by corresponding ones of the data packet signal transceivers.

Abstract: System and method for controlling test flow of a radio frequency (RF) signal transceiver device under test (DUT) by inducing an interrupt via an internal signal interface or an external signal interface (with one example of the latter being a baseband signal interface for conveying audio signals). With exemplary embodiments, one or more DUT control signals are provided to or otherwise initiated within the DUT by inducing an interrupt, including inducement via use of the signal interface. With further exemplary embodiments, one or more test control signals are also provided to RF circuitry that responds by transmitting one or more RF receive signals for the DUT and receives from the DUT one or more RF transmit signals related to the one or more DUT control signals.

Abstract: A fixing device for fixing a workpiece includes a base, a first pressing block pressing the workpiece to the base, a second pressing block, a first support member, a second support member, and a side pressing block. The workpiece includes a preprocessing portion to be machined, which has an inner surface and an outer surface, the inner and outer surfaces of the preprocessing portion are sandwiched between non-rigid materials during a machining process to avoid the generating of swarfs.

Abstract: A method for testing a data packet signal transceiver device under test (DUT) that minimizes time lost due to waiting for respective power levels of data packets transmitted by the DUT to settle at the desired nominal value for transmit signal testing. In accordance with exemplary embodiments, signals transmitted by the DUT during receive signal testing, e.g., as acknowledgement data packets, are transmitted at the nominal value for transmit signal testing, thereby allowing sufficient time for individual data packet signal power levels to settle and remain consistent at the nominal value by the time receive signal testing is completed and transmit signal testing is to begin.

Abstract: A method for testing a data packet signal transceiver device under test (DUT) that minimizes time lost due to waiting for respective power levels of data packets transmitted by the DUT to settle at the desired nominal value for transmit signal testing. In accordance with exemplary embodiments, signals transmitted by the DUT during receive signal testing, e.g., as acknowledgement data packets, are transmitted at the nominal value for transmit signal testing, thereby allowing sufficient time for individual data packet signal power levels to settle and remain consistent at the nominal value by the time receive signal testing is completed and transmit signal testing is to begin.

Abstract: A method for using a test data packet signal to test a data packet signal transceiver device under test (DUT) having an operating characteristic defined by a data packet error rate (PER) as a function of data packet signal power (PWR). The test data packet signal power is varied and a test PER is computed as a function of DUT response data packets and test data packets until a measured test PER or a computed test PER extrapolated from measured PERs is equal to a predetermined PER less than and greater than maximum and minimum PERs, respectively.

Abstract: A protective housing for an electronic device includes a main body, a protective cover, and a connecting mechanism. The protective cover is rotatably and detachably mounted to the main body by the connecting mechanism. The connecting mechanism includes a first magnetic assembly, a second magnetic assembly, and a mounting base. The first magnetic assembly is assembled within the main body, the second magnetic assembly is assembled within the mounting base. The mounting base is pivotally hinged to the protective cover, and the first magnetic assembly and the second magnetic assembly attract each other, thereby connecting the main body and the protective cover together.

Abstract: Method and system for facilitating testing of multiple time-division-duplex (TDD) data packet signal transceivers. Replicas of a data packet signal are transmitted by a tester to multiple TDD devices under test (DUTs), where the replicated signal is either a null or TDD data packet signal. In one embodiment, replica null data packet signals are transmitted for a predetermined time interval sufficient for the DUTs to synchronize with the tester. In another embodiment, following successful and unsuccessful receptions of responsive signals from respective DUTs indicating successful reception of their respective replica TDD data packet signals and, therefore, synchronization with the tester, corresponding replica TDD data packet signals are provided with data packet signal characteristics causing such replica data packet signals to fail to conform or to conform, respectively, with a predetermined data packet signal standard.

Abstract: A system and method for testing multiple-input-multiple-output (MIMO) devices under test (DUTs) with multiple radio frequency (RF) signal testers. Each tester receives one or more RF signals from one or more of the DUTs, and the testers are mutually coupled in a ring such that successive ones receive a trigger input signal from an upstream tester and provide a trigger output signal to a downstream tester. Each tester is responsive to its input trigger signal and its one or more RF signals by providing its output trigger signal such that its output trigger signal has an asserted state initiated in response to an assertion of its input trigger signal and a transcending of a predetermined magnitude by at least one of the one or more RF signals.

Abstract: The present invention relates to an IEEE1588 protocol negative testing method, comprises steps of: connecting a IEEE1588 tester and a slave clock DUT to establish a real-time closed-loop feedback mechanism; taking the IEEE1588 tester as a master clock, and establishing a stable time synchronization with the slave clock DUT; obtaining the timing offset or path delay of the slave clock DUT before disturbance; assembling an abnormal message in a frame and sending it to the slave clock DUT; calculating the timing offset or path delay increment after disturbance of the abnormal message; determining whether there is a sudden change in the timing offset or path delay of the slave clock DUT, wherein if there is no sudden change, the test passes; otherwise the test fails.

Abstract: A method of testing, such as for a bit error rate (BER), of multiple data packet signal transceivers during which a tester and the data packet signal transceivers exchange sequences of test data packets and summary data packets. The tester provides the test data packets which contain respective pluralities of data bits with respective predetermined bit patterns. Responsive thereto, the data packet signal transceivers provide the summary data packets which contain respective summary data indicative of the number of data bits with the respective predetermined bit patterns that are correctly received by corresponding ones of the data packet signal transceivers.

Abstract: Method and system for facilitating testing of multiple time-division-duplex (TDD) data packet signal transceivers. Replicas of a data packet signal are transmitted by a tester to multiple TDD devices under test (DUTs), where the replicated signal is either a null or TDD data packet signal. In one embodiment, replica null data packet signals are transmitted for a predetermined time interval sufficient for the DUTs to synchronize with the tester. In another embodiment, following successful and unsuccessful receptions of responsive signals from respective DUTs indicating successful reception of their respective replica TDD data packet signals and, therefore, synchronization with the tester, corresponding replica TDD data packet signals are provided with data packet signal characteristics causing such replica data packet signals to fail to conform or to conform, respectively, with a predetermined data packet signal standard.

Abstract: An electronic device using a lens module is disclosed. The lens module for a housing, comprises a barrel comprising a containing portion; and at least one lens insert molded mounted in the containing portion; wherein the containing portion comprises an inner sidewall, and a first latching portion in the inner sidewall; the at least one lens comprises a main body, and a second latching portion extends outward from a side surface of the main body; the second latching portion is received in the first latching portion.

Abstract: An electronic device housing includes a bottom housing, a support frame, and a plastic side frame. The support frame is fixed on the bottom housing to form a receiving groove between the bottom housing and the plastic side frame. The plastic side frame is integrally formed by injecting a plastic material in the receiving groove. A manufacturing method for an electronic device housing is also provided.