Patents by Inventor Guangding GE

Guangding GE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11121464
    Abstract: This application discloses a correction and testing system, comprising a first phased array, a second phased array, and a test instrument, wherein the first phased array comprises a first radio frequency RF channel, the test instrument is configured to: determine, based on a coupling signal, an amplitude deviation value and a phase deviation value that correspond to the first RF channel; if the amplitude deviation value and the phase deviation value satisfy a preset error correction condition, correct an amplitude coefficient and a phase coefficient that correspond to the first RF channel to obtain a target amplitude coefficient and a target phase coefficient; and measure performance indicator parameters of the first phased array by using the target amplitude coefficient and the target phase coefficient. The correction and testing system can improve test efficiency, reducing a floor area, and lowering costs.
    Type: Grant
    Filed: March 2, 2020
    Date of Patent: September 14, 2021
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Guangding Ge, Xubo Zhao, Deshuang Zhao
  • Publication number: 20200358177
    Abstract: This application discloses a correction and testing system, comprising a first phased array, a second phased array, and a test instrument, wherein the first phased array comprises a first radio frequency RF channel, the test instrument is configured to: determine, based on a coupling signal, an amplitude deviation value and a phase deviation value that correspond to the first RF channel; if the amplitude deviation value and the phase deviation value satisfy a preset error correction condition, correct an amplitude coefficient and a phase coefficient that correspond to the first RF channel to obtain a target amplitude coefficient and a target phase coefficient; and measure performance indicator parameters of the first phased array by using the target amplitude coefficient and the target phase coefficient. The correction and testing system can improve test efficiency, reducing a floor area, and lowering costs.
    Type: Application
    Filed: March 2, 2020
    Publication date: November 12, 2020
    Inventors: Guangding GE, Xubo ZHAO, Deshuang ZHAO