Patents by Inventor Guanhua Yin

Guanhua Yin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11605436
    Abstract: Countermeasure method for programming a non-defective plane of a non-volatile memory experiencing a neighbor plane disturb, comprising, once a first plane is determined to have completed programming of a current state but where not all planes have completed the programming, a loop count is incremented and a determination is made as to whether the loop count exceeds a threshold. If so, programming of the incomplete plane(s) is ceased and programming of the completed plane(s) is resumed by suspending the loop count and bit scan mode, and, on a next program pulse, applying a pre-determined rollback voltage to decrement a program voltage bias. The loop count and bit scan mode are resumed once a threshold voltage level equals a program voltage bias when the loop count was last incremented. BSPF criterion is applied for each programmed state. Advancement to the next loop only occurs if a programmed state is determined incomplete.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: March 14, 2023
    Assignee: SanDisk Technologies LLC
    Inventors: Henry Chin, Hua-Ling Hsu, Liang Li, Xuan Tian, Fanglin Zhang, Guanhua Yin
  • Publication number: 20220415421
    Abstract: An apparatus is provided that includes a plurality of non-volatile memory cells and a control circuit coupled to the non-volatile memory cells. The control circuit is configured to perform a first program-verify iteration on a first set of non-volatile memory cells coupled to a first word line to determine a first starting program voltage that programs the first set of the non-volatile memory cells to a first programmed state, and program a second set of non-volatile memory cells coupled to the first word line beginning with the first starting program voltage only if a defect condition does not exist.
    Type: Application
    Filed: June 28, 2021
    Publication date: December 29, 2022
    Applicant: SanDisk Technologies LLC
    Inventors: Xuan Tian, Guanhua Yin, Liang Li
  • Patent number: 11538538
    Abstract: An apparatus is provided that includes a plurality of non-volatile memory cells and a control circuit coupled to the non-volatile memory cells. The control circuit is configured to perform a first program-verify iteration on a first set of non-volatile memory cells coupled to a first word line to determine a first starting program voltage that programs the first set of the non-volatile memory cells to a first programmed state, and program a second set of non-volatile memory cells coupled to the first word line beginning with the first starting program voltage only if a defect condition does not exist.
    Type: Grant
    Filed: June 28, 2021
    Date of Patent: December 27, 2022
    Assignee: SanDisk Technologies LLC
    Inventors: Xuan Tian, Guanhua Yin, Liang Li
  • Publication number: 20220399061
    Abstract: Countermeasure method for programming a non-defective plane of a non-volatile memory experiencing a neighbor plane disturb, comprising, once a first plane is determined to have completed programming of a current state but where not all planes have completed the programming, a loop count is incremented and a determination is made as to whether the loop count exceeds a threshold. If so, programming of the incomplete plane(s) is ceased and programming of the completed plane(s) is resumed by suspending the loop count and bit scan mode, and, on a next program pulse, applying a pre-determined rollback voltage to decrement a program voltage bias. The loop count and bit scan mode are resumed once a threshold voltage level equals a program voltage bias when the loop count was last incremented. BSPF criterion is applied for each programmed state. Advancement to the next loop only occurs if a programmed state is determined incomplete.
    Type: Application
    Filed: June 21, 2021
    Publication date: December 15, 2022
    Applicant: SanDisk Technologies LLC
    Inventors: Henry Chin, Hua-Ling Hsu, Liang Li, Xuan Tian, Fanglin Zhang, Guanhua Yin