Abstract: A method for testing a digital circuit as a Device under Test—DUT, including determining a Bit Error Rate—BER—value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of executing the test for each one of the number of sample points for providing a statement about the condition of the DUT.

Abstract: For identifying or localizing a serial data stream in a deserialized output provided at a plurality of n output ports (PORT1-PORT5), a pattern recognition is provided at each one of the plurality of n output ports (PORT1-PORT5) for recognizing a deserialized identifier pattern corresponding to an identifier pattern within the serial data stream and for detecting a phase of the deserialized identifier pattern in the deserialized output. The phase of the output of each respective port (PORT1-PORT5) is then shifted in correspondence with the detected phase of the deserialized identifier pattern.

Abstract: For identifying or localizing a serial data stream in a deserialized output provided at a plurality of n output ports (PORT1-PORT5), a pattern recognition is provided at each one of the plurality of n output ports (PORT1-PORT5) for recognizing a deserialized identifier pattern corresponding to an identifier pattern within the serial data stream and for detecting a phase of the deserialized identifier pattern in the deserialized output. The phase of the output of each respective port (PORT1-PORT5) is then shifted in correspondence with the detected phase of the deserialized identifier pattern.

Abstract: A method for testing a digital circuit as a Device under Test—DUT (110), comprising the steps of determining a Bit Error Rate—BER—value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of the tests of step (b) for providing a statement about the condition of the DUT (110).