Patents by Inventor Guillaume Delpy

Guillaume Delpy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tomography sample preparation systems and methods with improved speed, automation, and reliability
    Patent number: 10190953
    Abstract: Sample pillars for x-ray tomography or other tomography scanning are created using an innovative milling strategy on a Plasma-FIB. The strategies are provided in methods, systems, and program products executable to perform the strategies herein. The milling strategy creates an asymmetrical crater around a sample pillar, and provides a single cut cut-free process. Various embodiments may include tuning the ion dose as a function of pixel coordinates along with optimization of the beam scan and crater geometries, drastically reducing the preparation time and significantly improving the overall workflow efficiency. A novel cut-free milling pattern is provided with a crescent shape and optimized dwell-time values.
    Type: Grant
    Filed: November 2, 2017
    Date of Patent: January 29, 2019
    Inventors: Guillaume Delpy, Guillaume Audoit, Laurens Franz Taemsz Kwakman, Chad Rue, Jorge Filevich
  • TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPEED, AUTOMATION, AND RELIABILITY
    Publication number: 20180143110
    Abstract: Sample pillars for x-ray tomography or other tomography scanning are created using an innovative milling strategy on a Plasma-FIB. The strategies are provided in methods, systems, and program products executable to perform the strategies herein. The milling strategy creates an asymmetrical crater around a sample pillar, and provides a single cut cut-free process. Various embodiments may include tuning the ion dose as a function of pixel coordinates along with optimization of the beam scan and crater geometries, drastically reducing the preparation time and significantly improving the overall workflow efficiency. A novel cut-free milling pattern is provided with a crescent shape and optimized dwell-time values.
    Type: Application
    Filed: November 2, 2017
    Publication date: May 24, 2018
    Applicant: FEI Company
    Inventors: Guillaume Delpy, Guillaume Audoit, Laurens Franz Taemsz Kwakman, Chad Rue