Patents by Inventor Guillaume Dovillaire

Guillaume Dovillaire has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for correcting a wave front analyser and analyser implementing said method
    Patent number: 8725447
    Abstract: A method for correcting a wave front analyzer, in which the analyzer detects a signal from an incident wave front to be analyzed (FO), the detected signal providing phase and intensity local information. The method includes correcting the phase computation according to intensity space variations. A wave front analyzer for implementing the method is also described.
    Type: Grant
    Filed: October 16, 2007
    Date of Patent: May 13, 2014
    Assignee: Imagine Optic
    Inventors: Xavier Levecq, Guillaume Dovillaire
  • Instrument and method for characterising an optical system
    Patent number: 8593623
    Abstract: An instrument (1) for characterizing an optical system, includes: at least one primary source (3) for emitting an illumination light beam (FE); an optical device for directing the illumination beam (FE) onto the optical system (L) to be characterized; a wave front analyzer (4) adapted for receiving a beam from the optical system (L); and a unit for processing the measure signals from the wave front analyzer (4), adapted for providing characterization information of the optical system (L). The instrument further includes a scattering member (22) substantially provided in the focal plane of the optical system (L) so as to create a secondary source generating a secondary beam flowing through the optical system (L) and further directed towards the wave front analyzer.
    Type: Grant
    Filed: January 16, 2009
    Date of Patent: November 26, 2013
    Assignee: Imagine Optic
    Inventors: Xavier Levecq, Guillaume Dovillaire
  • INSTRUMENT AND METHOD FOR CHARACTERISING AN OPTICAL SYSTEM
    Publication number: 20110134417
    Abstract: An instrument (1) for characterizing an optical system, includes: at least one primary source (3) for emitting an illumination light beam (FE); an optical device for directing the illumination beam (FE) onto the optical system (L) to be characterized; a wave front analyzer (4) adapted for receiving a beam from the optical system (L); and a unit for processing the measure signals from the wave front analyzer (4), adapted for providing characterization information of the optical system (L). The instrument further includes a scattering member (22) substantially provided in the focal plane of the optical system (L) so as to create a secondary source generating a secondary beam flowing through the optical system (L) and further directed towards the wave front analyzer.
    Type: Application
    Filed: January 16, 2009
    Publication date: June 9, 2011
    Applicant: IMAGINE OPTIC
    Inventors: Xavier Levecq, Guillaume Dovillaire
  • METHOD FOR CORRECTING A WAVE FRONT ANALYSER AND ANALYSER IMPLEMENTING SAID METHOD
    Publication number: 20110134415
    Abstract: A method for correcting a wave front analyzer, in which the analyzer detects a signal from an incident wave front to be analyzed (FO), the detected signal providing phase and intensity local information. The method includes correcting the phase computation according to intensity space variations. A wave front analyzer for implementing the method is also described.
    Type: Application
    Filed: October 16, 2007
    Publication date: June 9, 2011
    Applicant: IMAGINE OPTIC
    Inventors: Xavier Levecq, Guillaume Dovillaire