Abstract: A system and a consumer electronics kit include an infrared transmitter module and an infrared receiver module. The infrared transmitter module includes a video input that a user can connect to a video output of a portable image display/storage device. The infrared receiver module includes an infrared detector configured to receive infrared signals from said infrared transmitter module, where the received infrared signals contain image information of one or more images stored on the portable image display/storage device. The image information may be still image data representing photographs, moving image data, image data generated by an application program. The infrared receiver module includes a connector that a user can connect to a video input of an electronic device. The electronic device may comprise a display device such as a television or computer monitor, an LCD display, or a portable viewer housing the infrared receiver module and an LCD display.

Abstract: A substrate inspection system includes a plurality of load-lock-less inspection chambers, which are share a single pump unit. A plurality of valves are configured to selectively couple the pump unit to a selected one of the plurality of inspection chambers. The pump unit is configured to pump air out of the selected one of the plurality of inspection chambers while a substrate or substrates in one or more of the remaining plurality of load-lock-less inspection chambers is being inspected. Each load-lock-less inspection chamber may have an associated plurality of rows of electron guns. The plurality of rows of electron guns are operable to provide an electron source for performing voltage waveform contrasting. By employing load-lock-less inspection chambers, a single, shared pump unit, and/or the plurality of rows of electron guns, the footprint of the substrate inspection system can be minimized.

Abstract: Methods of and apparatus for detecting pixel element defects in flat panel display (FPDs). Floating pixel elements (fpes) of uncompleted active plates in a manufacturing process are activated with high frequency AC test signals. In response to the activation signal, a high frequency output signal is produced by a voltage divider formed by an impedance of the fpe under test and an impedance presented by high frequency elements (e.g. stray capacitances) associated with the fpe under test. A signal characteristic (e.g. the amplitude) of the output signal is compared to an expected characteristic to determine the presence of pixel element defects. The methods of the present invention may be performed prior to completion of the active plate, e.g., prior to forming a liquid crystal between plates of a passive matrix LCD and prior to coating a partially formed OLED active plate with light emitting organic material layers.

Abstract: An apparatus for testing pixels of a flat panel display has a palette for holding a TFT substrate, drive signal source units, and predetermined voltage source units. The palette is grounded. One of the predetermined voltage source units applies a predetermined voltage to a Cs electrode of each of pixels constituting the TFT substrate so that the predetermined voltage is used as a reference voltage of the TFT substrate 11. The drive signal source units supply drive signals to a gate electrode G and a source electrode S respectively in each of the pixels constituting the TFT substrate. The voltages of the drive signals are floated by predetermined voltages given by the corresponding predetermined voltage source units respectively.

Abstract: An apparatus for testing plural pixels arranged in a matrix array on a TFT substrate comprises an electron gun for incidenting the electron beam to the TFT substrate, a secondary electron detector for detecting the amount of secondary electrons generated by incidenting the electron beam to the TFT substrate, and a stage for carrying the TFT substrate which is held thereon. The electron gun is placed against the TFT substrate held on the stage and incidents the electron beam to each basic scanning area. The electron gun scans the electron beam in one basic scanning area a predetermined number of times to obtain a secondary electron waveform necessary for testing the presence/absence of a defect in the pixel. The stage is always moved while the electron gun scans the electron beam in each basic scanning area, whereby the entire area of the TFT substrate is tested.

Abstract: An apparatus for testing plural pixels arranged in a matrix array on a TFT substrate comprises an electron gun for incidenting the electron beam to the TFT substrate, a secondary electron detector for detecting the amount of secondary electrons generated by incidenting the electron beam to the TFT substrate, and a stage for carrying the TFT substrate which is held thereon. The electron gun is placed against the TFT substrate held on the stage and incidents the electron beam to each basic scanning area. The electron gun scans the electron beam in one basic scanning area a predetermined number of times to obtain a secondary electron waveform necessary for testing the presence/absence of a defect in the pixel. The stage is always moved while the electron gun scans the electron beam in each basic scanning area, whereby the entire area of the TFT substrate is tested.

Abstract: An apparatus for testing pixels of a flat panel display has a palette for holding a TFT substrate, drive signal source units, and predetermined voltage source units. The palette is grounded. One of the predetermined voltage source units applies a predetermined voltage to a Cs electrode of each of pixels constituting the TFT substrate so that the predetermined voltage is used as a reference voltage of the TFT substrate 11. The drive signal source units supply drive signals to a gate electrode G and a source electrode S respectively in each of the pixels constituting the TFT substrate. The voltages of the drive signals are floated by predetermined voltages given by the corresponding predetermined voltage source units respectively.