Abstract: Provided are an inspection device and an inspection method thereof, an inspection system. The inspection device includes: a transmission imaging apparatus for constructing a transmission image of an inspected object; and a diffraction detection apparatus for detecting characteristics of at least part of the inspected object. The transmission imaging apparatus defines an inspection channel. The inspection device includes a linear track spanning the inspection channel along a lateral direction. The diffraction detection apparatus is movable along the linear track to a specific position to detect radiations diffracted by at least part of the inspected object.

Abstract: A CT machine is provided, including: a first frame; a plurality of supporting devices on the first frame; a rotatable portion capable of rotating around a rotation axis when driven by a driving wheel, and the rotatable portion being jointly supported by the plurality of supporting devices during rotation; a scanning device comprising a ray source and a detector, the ray source and the detector being both arranged on the rotatable portion; and an axial limiting mechanism for limiting movements of the rotatable portion along a first direction and a second direction, the first direction and the second direction being both parallel to the rotation axis, and the first direction being opposite to the second direction.

Abstract: The present disclosure provides a diffraction detection apparatus, an inspection device, an inspection method and an inspection system. The diffraction detection apparatus includes a bracket, a diffraction radiation source, and a diffraction radiation detector, where the diffraction radiation detector and the diffraction radiation source define an inspection channel extending along a first direction, and the diffraction radiation detector is configured to receive diffracted radiation from an inspected object on the inspection channel to determine a characteristic of a substance causing diffraction. The bracket is configured to allow the diffraction radiation source and the diffraction radiation detector to move on the bracket across the inspection channel in a second direction, where the second direction is transverse to the first direction.

Abstract: A conveying system for an inspection device, including an imaging system, used to scan and inspect an object; a first transmission mechanism configured to convey the object to the imaging system; and a supporting structure intersecting an inspection surface of the imaging system, where the object is pushed to slide along the supporting structure and passes through the imaging system. The first transmission mechanism includes: a chassis; a driving device; a lead screw driven by the driving device; a first slide rail, where an extension direction of the first slide rail is parallel to an extension direction of the lead screw; and a sliding mechanism connected to the lead screw, where the lead screw may drive the sliding mechanism to move along the extension direction of the lead screw, so that the sliding mechanism pushes the object to slide on the first slide rail and the supporting structure.

Abstract: The present disclosure relates to a field of detection apparatus technology, and in particular, to an attitude adjustment structure, a conveying device, and a radiation imaging system. An attitude adjustment structure includes: a base body, arranged in an X direction, the base body having a bearing surface, and the bearing surface being configured to place a detected object; a first adjustment assembly, arranged on the base body and configured to drive the detected object to deviate around a Y direction on the bearing surface and drive the detected object to move in the X direction; and at least one second adjustment assembly, arranged on the base body and configured to drive the detected object to rotate around a Z direction.