Patents by Inventor Gun-hee Kim

Gun-hee Kim has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20130256653
    Abstract: A plural semiconductive oxides TFT (sos-TFT) provides improved electrical functionality in terms of charge-carrier mobility and/or threshold voltage variability. The sos-TFT may be used to form a thin film transistor array panel for display devices. An example sos-TFT includes: an insulated gate electrode; a first semiconductive oxide layer having a composition including a first semiconductive oxide; and a second semiconductive oxide layer having a different composition that also includes a semiconductive oxide. The first and second semiconductive oxide layers have respective channel regions that are capacitively influenced by a control voltage applied to the gate electrode. In one embodiment, the second semiconductive oxide layer includes at least one additional element that is not included in the first semiconductive oxide layer where the additional element is one of gallium (Ga), silicon (Si), niobium (Nb), hafnium (Hf), and germanium (Ge).
    Type: Application
    Filed: July 23, 2012
    Publication date: October 3, 2013
    Applicant: SAMSUNG DISPLAY CO., LTD.
    Inventors: Byung Du AHN, Ji Hun LIM, Gun Hee KIM, Kyoung Won LEE, Je Hun LEE
  • Publication number: 20130248855
    Abstract: This oxide for a semiconductor layer of a thin-film transistor contains Zn, Sn and In, and the content (at %) of the metal elements contained in the oxide satisfies formulas (1) to (3) when denoted as [Zn], [Sn] and [In], respectively. [In]/([In]+[Zn]+[Sn])??0.53×[Zn]/([Zn]+[Sn])+0.36 (1) [In]/([In]+[Zn]+[Sn])?2.28×[Zn]/([Zn]+[Sn])?2.01 (2) [In]/([In]+[Zn]+[Sn])?1.1×[Zn]/([Zn]+[Sn])?0.32 (3) The present invention enables a thin-film transistor oxide that achieves high mobility and has excellent stress resistance (negligible threshold voltage shift before and after applying stress) to be provided.
    Type: Application
    Filed: November 28, 2011
    Publication date: September 26, 2013
    Applicants: Samsung Display Co., Ltd., Kabushiki Kaisha Kobe Seiko Sho(Kobe Steel, Ltd.)
    Inventors: Aya Miki, Shinya Morita, Toshihiro Kugimiya, Satoshi Yasuno, Jae Woo Park, Je Hun Lee, Byung Du Ahn, Gun Hee Kim
  • Patent number: 8523996
    Abstract: A method of fabricating a liquid for an oxide thin film is provided, which includes mixing at least two kinds of dispersoids selected from the group consisting of a Zinc compound, an Indium compound, a Gallium compound, a Tin compound and a Thallium compound, with dispersion media corresponding to the selected dispersoids to form a dispersion system, and stirring and aging the dispersion system at a predetermined temperature for a predetermined time, wherein a molar ratio of the Zinc compound to each of the Indium compound, Gallium compound, Tin compound and Thallium compound is 1:0.1 to 1:2. According to the present invention, the liquid for the oxide thin film may be fabricated by a sol-gel method making it capable of being implemented in mass production in a simple and low-cost manner as opposed to the conventional vacuum deposition method.
    Type: Grant
    Filed: February 14, 2008
    Date of Patent: September 3, 2013
    Assignee: Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Hyun Jae Kim, Kyung Ho Kim, Gun Hee Kim, Tae Hoon Jeong, Hyun Soo Shin, Won Jun Park, Yun Jung Choi, Ka Young Lee
  • Publication number: 20130181212
    Abstract: A semiconductor device includes: a substrate, a semiconductor layer including an oxide semiconductor disposed on the substrate, a barrier layer disposed on the semiconductor layer and an insulating layer disposed on the barrier layer. The semiconductor layer includes an oxide semiconductor, and the barrier layer includes a material having a lower standard electrode potential than a semiconductor material of the oxide semiconductor, a lower electron affinity than the semiconductor material of the oxide semiconductor, or a larger band gap than the semiconductor material of the oxide semiconductor. The insulating layer includes at least one of a silicon-based oxide or a silicon-based nitride, and the insulating layer includes a portion which contacts with an upper surface of the barrier layer.
    Type: Application
    Filed: July 6, 2012
    Publication date: July 18, 2013
    Inventors: Gun Hee KIM, Jae Woo PARK, Jin Hyun PARK, Byung Du AHN, Je Hun LEE, Yeon Hong KIM, Jung Hwa KIM, Sei-Yong PARK, Jun Hyun PARK, Kyoung Won LEE, Ji Hun LIM
  • Publication number: 20130114013
    Abstract: A display device includes a first substrate, a gate line disposed on the first substrate and including a gate electrode, a gate insulating layer disposed on the gate line, a semiconductor layer disposed on the gate insulating layer, a data line disposed on the semiconductor layer and connected to a source electrode, a drain electrode disposed on the semiconductor layer and facing the source electrode and a passivation layer disposed on the data line, in which the semiconductor layer is formed of an oxide semiconductor including indium, tin, and zinc. The indium is present in an amount of about 5 atomic percent (at %) to about 50 at % , and a ratio of the zinc to the tin is about 1.38 to about 3.88.
    Type: Application
    Filed: June 7, 2012
    Publication date: May 9, 2013
    Inventors: Jae Woo Park, Je Hun Lee, Byung Du Ahn, Sei-Yong Park, Jun Hyun Park, Gun Hee Kim, Ji Hun Lim, Kyoung Won Lee
  • Publication number: 20130075720
    Abstract: An oxide semiconductor includes a first material including at least one selected from the group consisting of zinc (Zn) and tin (Sn), and a second material, where a value acquired by subtracting an electronegativity difference value between the second material and oxygen (O) from the electronegativity difference value between the first material and oxygen (O) is less than about 1.3.
    Type: Application
    Filed: July 20, 2012
    Publication date: March 28, 2013
    Applicants: Kobe Steel, Ltd., SAMSUNG DISPLAY CO., LTD.
    Inventors: Byung Du AHN, Je Hun LEE, Sei-Yong PARK, Jun Hyun PARK, Gun Hee KIM, Ji Hun LIM, Jae Woo PARK, Jin Seong PARK, Toshihiro KUGIMIYA, Aya MIKI, Shinya MORITA, Tomoya KISHI, Hiroaki TAO
  • Patent number: 8319300
    Abstract: A solution composition for forming an oxide thin film may include a first compound including zinc, a second compound including indium, and a third compound including magnesium or hafnium, and an electronic device may include an oxide semiconductor including zinc, indium, and magnesium. The zinc and hafnium may be included at an atomic ratio of about 1:0.01 to about 1:1.
    Type: Grant
    Filed: April 9, 2010
    Date of Patent: November 27, 2012
    Assignees: Samsung Electronics Co., Ltd., Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Jong-Baek Seon, Hyun-Jae Kim, Sang-Yoon Lee, Myung-Kwan Ryu, Hyun-Soo Shin, Kyung-Bae Park, Woong-Hee Jeong, Gun-hee Kim, Byung-Du Ahn
  • Publication number: 20120080678
    Abstract: Exemplary embodiments provide compositions for a solution process, electronic devices fabricated using the same, and fabrication methods thereof An oxide nano-structure is formed using a sol-gel process. An oxide thin film transistor is formed using the oxide nano-structure.
    Type: Application
    Filed: May 24, 2010
    Publication date: April 5, 2012
    Applicant: Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Hyun Jae Kim, Woong Hee Jeong, Byung Du Ahn, Gun Hee Kim
  • Publication number: 20100258793
    Abstract: A solution composition for forming an oxide thin film may include a first compound including zinc, a second compound including indium, and a third compound including magnesium or hafnium, and an electronic device may include an oxide semiconductor including zinc, indium, and magnesium. The zinc and hafnium may be included at an atomic ratio of about 1:0.01 to about 1:1.
    Type: Application
    Filed: April 9, 2010
    Publication date: October 14, 2010
    Inventors: Jong-Baek Seon, Hyun-Jae Kim, Sang-Yoon Lee, Myung-Kwan Ryu, Hyun-Soo Shin, Kyung-Bae Park, Woong-Hee Jeong, Gun-Hee Kim, Byung-Du Ahn
  • Publication number: 20100251936
    Abstract: A method of fabricating a liquid for an oxide thin film is provided, which includes mixing at least two kinds of dispersoids selected from the group consisting of a Zinc compound, an Indium compound, a Gallium compound, a Tin compound and a Thallium compound, with dispersion media corresponding to the selected dispersoids to form a dispersion system, and stirring and aging the dispersion system at a predetermined temperature for a predetermined time, wherein a molar ratio of the Zinc compound to each of the Indium compound, Gallium compound, Tin compound and Thallium compound is 1:0.1 to 1:2. According to the present invention, the liquid for the oxide thin film may be fabricated by a sol-gel method making it capable of being implemented in mass production in a simple and low-cost manner as opposed to the conventional vacuum deposition method.
    Type: Application
    Filed: February 14, 2008
    Publication date: October 7, 2010
    Applicant: INDUSTRY-ACADEMIC COOPERATION FOUNDATION ,
    Inventors: Hyun Jae Kim, Kyung Ho Kim, Gun Hee Kim, Tae Hoon Jeong, Hyun Soo Shin, Won Jun Park, Yun Jung Choi, Ka Young Lee
  • Publication number: 20100219975
    Abstract: A digital card system based on place recognition for supporting communication, which enables people who cannot communicate by the way of speech or writing to communicate by using a digital cards, is provided. Therefore, a user can rapidly and simply search digital cards for communication in response to various situations.
    Type: Application
    Filed: August 5, 2009
    Publication date: September 2, 2010
    Inventors: Gun Hee Kim, Man Chul Han, Se Hyung Park, Hyun Chul Park, Lae Hyun Kim, Sung Do Ha