Abstract: An apparatus for inspecting a display board or a circuit board in which an inspection terminal 4 of an inspection probe block B is pressed into contact with an electrode pad 3 of a display board or a circuit portion P for inspection. A probe block supporting frame member 2 has an expandable and contractible structure, and when the probe block supporting frame member 2 is expanded, a board supporting frame member 1 can be relatively advanced. Due to the relative advancement of the board supporting frame member 1, the display board or the circuit board P protrudes forward of a distal end of the terminal 4 of the probe block B through an enlarged opening area 16 of the probe supporting frame member 2, so that the display board or the circuit board P supported on the board supporting frame member 1 can be exchanged with another board.

Abstract: A supporting framework for a display panel or a probe block is capable of properly coping with display panels of different sizes in a testing apparatus. By moving a framework 1 with a display panel supported thereon or by moving frame members 2, 3, 4, 5 of the framework 1 with a probe block supported thereon, an opening (or space) defined by the respective frame members can be enlarged or reduced.

Abstract: There is provided an aligner that improves contact between a glass mask and an object to be exposed. In one preferred mode, a pressure glass 3 is set at a rear side of a glass mask 1 to form a closed space 4. A pressurized air is introduced from a pressure source 5 into the closed space 4 to raise the pressure of the closed space 4 and expand the glass mask 1 toward the object to be exposed, i.e., a board 50, by which the closeness of the contact between the glass mask 1 and the board 50 improves.

Abstract: To enable exchange of a display board or a circuit board generally in an occupation space at the time of inspection of a board, to eliminate the need of a side space which is conventionally needed for use of exchange, and to greatly miniaturize an apparatus for inspecting a display board or a circuit board.

Abstract: To provide a supporting framework for a display panel or a probe block capable of properly coping with display panels of different sizes in a testing apparatus. By moving a framework 1 with a display panel supported thereon or by moving frame members 2, 3, 4, 5 of the framework 1 with a probe block supported thereon, an opening (or space) defined by the respective supporting frameworks 1 can be enlarged or reduced.