Patents by Inventor Gunter Leupke

Gunter Leupke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Contactless optical probe for use in semiconductor processing metrology
    Patent number: 6856159
    Abstract: A method and/or device (285) for determining first and second band offsets (100, 110) at a semiconductor/dielectric heterointerface (115), which includes the semiconductor/dielectric heterointerface (115) exposed to incident photons (205) from a light source (200); a detector (275, 280) for generating a signal by detecting emitted photons (260, 265) from the semiconductor/dielectric heterointerface (115); and an element (310) for changing the energy of incident photons (205) to monitor the first and second band offsets (100, 110).
    Type: Grant
    Filed: March 15, 2000
    Date of Patent: February 15, 2005
    Assignee: Vanderbilt University
    Inventors: Norman H. Tolk, Gunter Leupke, Wei Wang