Patents by Inventor Gunter W. Daberko

Gunter W. Daberko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Calibration reticle for measuring microscopes
    Patent number: 4055376
    Abstract: A calibration reticle for measuring microscopes is disclosed in which a calibrated distance is established by calibration reference lines whose locations are defined by selected features of the calibration pattern. Preferably, the calibration reference lines are not physically manifest on the calibration reticle, except by the selected features which specify the locations of the calibration reference lines.
    Type: Grant
    Filed: October 2, 1975
    Date of Patent: October 25, 1977
    Assignee: Rockwell International Corporation
    Inventor: Gunter W. Daberko