Patents by Inventor Gunter Wesemann

Gunter Wesemann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Echelle spectometer with improved use of the detector by means of two spectrometer arrangements
    Patent number: 7804593
    Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40).
    Type: Grant
    Filed: June 2, 2005
    Date of Patent: September 28, 2010
    Assignee: Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
    Inventors: Helmut Becker-Roβ, Stefan Florek, Günter Wesemann, Michael Okruss
  • Echelle Spectometer with Improved Use of the Detector by Means of Two Spectrometer Arrangements
    Publication number: 20080094626
    Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40).
    Type: Application
    Filed: June 2, 2005
    Publication date: April 24, 2008
    Inventors: Helmut Becker-Ross, Stefan Florek, Gunter Wesemann, Michael Okruss