Abstract: A contact element system has a plurality of pin-type or needle-type and electrically conductive contact elements of equal length, which each have two end regions for electrically contacting contact positions and each have an intermediate region under longitudinal loading, overcoming their bending rigidity, and are designed with lamellar sections in the intermediate region such that they have at least two strips which are substantially parallel to each other and run at a distance from one another. At least two of the contact elements have different cross sectional surfaces and differently formed strips in the intermediate region, wherein the forms of the strips are chosen such that the contact elements have the same or approximately the same bending rigidity.

Abstract: The invention relates to a test card (1) for electrically connecting a test piece (2) to an electrical test device (3), having at least one holding element (4, 5) and having a plurality of electrically conductive contact devices (9) which are guided and supported by the holding element (4, 5), wherein the holding element (4, 5) has a plurality of openings (8) for guiding and/or supporting the contact devices (9) through which openings in each case one of the contact devices (9) extends. According to the invention, the holding element (4, 5) has a three-dimensional structure.

Abstract: A method for producing a contact spacing converter space transformer) which has electrical contacts that form electrical paths and in which a first contact spacing of the contacts is converted into a comparatively different, second contact spacing of the electrical contacts including producing at least one base part from each of at least some of the electrical contacts. At least a section of the base part is produced from plastic. The method subsequently includes metallization of at least the section of the base part that is produced from plastic.

Abstract: A contact element system has a plurality of pin-type or needle-type and electrically conductive contact elements of equal length, which each have two end regions for electrically contacting contact positions and each have an intermediate region under longitudinal loading, overcoming their bending rigidity, and are designed with lamellar sections in the intermediate region such that they have at least two strips which are substantially parallel to each other and run at a distance from one another. At least two of the contact elements have different cross sectional surfaces and differently formed strips in the intermediate region, wherein the forms of the strips are chosen such that the contact elements have the same or approximately the same bending rigidity.

Abstract: A method for producing a contact spacing converter space transformer) which has electrical contacts that form electrical paths and in which a first contact spacing of the contacts is converted into a comparatively different, second contact spacing of the electrical contacts including producing at least one base part from each of at least some of the electrical contacts. At least a section of the base part is produced from plastic. The method subsequently includes metallization of at least the section of the base part that is produced from plastic.

Abstract: An electrical contacting device for electrical physical contact with a specimen, particularly wafers, taking place in a contacting direction, with at least one conductor substrate which can be electrically connected to a testing device, at least one contact distance transformer and at least one contact head having electrical contact elements, particularly resilient contact elements, preferably serving to compensate different physical contact distances existing in the contacting direction particularly at the contact elements.

Abstract: The present disclosure relates to a test head for electrical testing of a test specimen, in particular a wafer, having at least two guide plates, which are spaced apart by means of at least one spacer and have guide holes distributed over the surfaces thereof, in which test contact pins for physical contact with the test specimen are guided in a sliding manner. Provision is made for the spacer to be formed by a multiplicity of point supports arranged in a manner distributed over the surfaces of the guide plates and secured on the guide plates.

Abstract: An electrical contacting device for electrical physical contact with a specimen, particularly wafers, taking place in a contacting direction, with at least one conductor substrate which can be electrically connected to a testing device, at least one contact distance transformer and at least one contact head having electrical contact elements, particularly resilient contact elements, preferably serving to compensate different physical contact distances existing in the contacting direction particularly at the contact elements.

Abstract: Door handle assembly (1) for a vehicle, including a door handle (2) for actuating a door lock (6), which can be moved by external power from a level rest position to an exposed operative position, and a lock cylinder (3) placed adjacent to the door handle (2) for locking and unlocking the door lock (6). The lock cylinder (3) can be covered by a cover plate (4) which, when actuated by hand, exposes the lock cylinder (3) and allows switch of the door handle (2) from the rest position to the operative position.

Abstract: A camera arrangement for a vehicle, with a camera unit constructed to be pivoted between an active position and an inactive position, and a chamber accommodating the camera unit, wherein in the inactive position a sealing cover that seals the chamber is arranged on the camera unit, with the camera unit being inaccessible from outside, and wherein in the active position the camera unit is pivoted out of the chamber for optically capturing a surrounding area and the camera unit seals the chamber. A method for installing the camera arrangement in a vehicle is also disclosed.

Abstract: The present disclosure relates to a test head for electrical testing of a test specimen, in particular a wafer, having at least two guide plates, which are spaced apart by means of at least one spacer and have guide holes distributed over the surfaces thereof, in which test contact pins for physical contact with the test specimen are guided in a sliding manner. Provision is made for the spacer to be formed by a multiplicity of point supports arranged in a manner distributed over the surfaces of the guide plates and secured on the guide plates.

Abstract: Door handle assembly (1) for a vehicle, including a door handle (2) for actuating a door lock (6), which can be moved by external power from a level rest position to an exposed operative position, and a lock cylinder (3) placed adjacent to the door handle (2) for locking and unlocking a door lock (6). The lock cylinder (3) can be covered by a cover plate (4) which, when actuated by hand, exposes the lock cylinder (4) and allows switch of the door handle (2) from the rest position to the operative position.

Abstract: A camera arrangement for a vehicle, with a camera unit constructed to be pivoted into an active position and into an inactive position, and a chamber accommodating the camera unit, wherein in the inactive position a sealing cover that seals the chamber is arranged on the camera unit, with the camera unit being inaccessible from outside, and wherein in the active position the camera unit is pivoted out of the chamber for optically capturing a surrounding area and the camera unit seals the chamber. A method for installing the camera arrangement in a vehicle is also disclosed.

Abstract: A locking device for an automobile includes a rotary latch supported in the housing for rotation, a locking bracket lockingly engaging with the locking device when the rotary latch is in a locked position, a catch hook having a hook section constructed to securely engage behind the locking bracket when the catch hook is in a catch position, and a locking pawl controlling rotation of the rotary latch. In response to a first unlocking actuation, the locking pawl is unlocked, rotating the rotary latch into the opening direction of rotation up to an unlocking position of the rotary latch which unlocks the locking bracket. In response to a second unlocking actuation, the catch hook rotates into the opening direction of rotation up to a release position of the locking bracket of the locking pawl, thereby releasing the catch hook.

Abstract: A contact-making apparatus for electrical connection of a unit under test to an electrical test device, having a plurality of electrical contacts which are associated with at least one holding element. The contact-making apparatus and preferably the holding element thereof, is provided with at least one marking which is in a defined position with respect to at least one of the contacts. The marking is detected for alignment of the apparatus and the unit. A corresponding method of use and a method of manufacture are also disclosed.

Abstract: An oligosaccharide mixture based on oligosaccharides from one or several animal milks composed of two or more monosaccharide units. The oligosaccharide mixture comprises at least two oligosaccharide fractions which are each composed of at least two different oligosaccharides. Lactose does not pertain thereto and the total spectrum of the oligosaccharides in the oligosaccharide mixture differs from those present in animal milk or animal milks, wherefrom the oligosaccharide fractions are extracted and that a) if the oligosaccharides are extracted from only one animal milk, the proportion of neutral oligosaccharides to acidic oligosaccharides is 90-60:10-40 weight %, or b) if the oligosaccharides are extracted from at least two animal milks, the oligosaccharides extracted from two different animal milks each make up 10 weight % of the total amount of oligosaccharides present in the oligosaccharide mixture. The oligosaccharide mixture approximates human milk with respect to its positive properties.

Abstract: A contacting device for touch contacting an electrical test specimen includes a contact head and a connecting device. The contact head with the test specimen have electrically touch contactable test contacts, the positions of which are distributed across a testing surface and are determined by at least one guide element that belongs to the contact head and that is fastened to a holding device of the contact head. The test contacts, on their side facing away from the test specimen, are to be brought into electrical touch contact with contact surfaces of the connecting device. It is provided that the guide element is composed of individual segments that each have a part of the testing surface and are each connected to at least one of the holding device and the connecting device by at least one fixed bearing.

Abstract: The invention relates to an electrical test device for testing electrical test pieces comprising at least one electrical contact system and at least one electrical connecting device provided with at least one electrical/electronic component, and having contact surfaces for touch contacting of the contact system which may be contacted by the test piece, and having a wiring substrate and a connecting element; wherein the electrical/electronic component is carried by the connecting element.

Abstract: The present disclosure relates to an electrical testing device for testing electrical test samples, the electrical testing device comprising an electrical connecting device having contact surfaces for touch contacting a contact arrangement that is contactable with the test sample and to which a support device is allocated, and a middle centering device that permits only radial temperature compensation clearance using a plurality of guides for the central alignment of the support device and connecting device relative to one another.

Abstract: The invention relates to a test device for electrical testing of a unit under test, in particular for the testing of wafers, having a contact head which can be associated with the unit under test and is provided with contact elements which are in the form of pins and form a contact pin arrangement, and having an electrical connecting apparatus, which has contact surfaces which make a touching contact with those ends of the contact elements which face away from the test plane accommodating the unit under test. The invention provides that the contact surfaces are on axial contact elements which extend in the axial direction and are in the form of mechanically processed contact surfaces.